相关论文: Improved Defect Detection and Classification Metho…

This paper presents a simple yet effective two-stage framework for semi-supervised medical image segmentation. Unlike prior state-of-the-art semi-supervised segmentation methods that predominantly rely on pseudo supervision directly on…

Detection of high impedance faults (HIF) has been one of the biggest challenges in the power distribution network. The low current magnitude and diverse characteristics of HIFs make them difficult to be detected by over-current relays.…

In semi-supervised learning, methods that rely on confidence learning to generate pseudo-labels have been widely proposed. However, increasing research finds that when faced with noisy and biased data, the model's representation network is…

In the realm of industrial quality inspection, defect detection stands as a critical component, particularly in high-precision, safety-critical sectors such as automotive components aerospace, and medical devices. Traditional methods,…

Ultrasonic testing is a common Non-Destructive Inspection (NDI) method used in aerospace manufacturing. However, the complexity and size of the ultrasonic scans make it challenging to identify defects through visual inspection or machine…

Image segmentation is fundamental to microstructural analysis for defect identification and structure-property correlation, yet remains challenging due to pronounced heterogeneity in materials images arising from varied processing and…

Shrinking pattern dimensions leads to an increased variety of defect types in semiconductor devices. This has spurred innovation in patterning approaches such as Directed self-assembly (DSA) for which no traditional, automatic defect…

Deep learning has proven to be a very effective approach for Hyperspectral Image (HSI) classification. However, deep neural networks require large annotated datasets to generalize well. This limits the applicability of deep learning for HSI…

The use of Deep Learning techniques for classification in Hyperspectral Imaging (HSI) is rapidly growing and achieving improved performances. Due to the nature of the data captured by sensors that produce HSI images, a common issue is the…

Hyperspectral image (HI) analysis approaches have recently become increasingly complex and sophisticated. Recently, the combination of spectral-spatial information and superpixel techniques have addressed some hyperspectral data issues,…

Utilizing Convolutional Neural Networks (CNNs), Recurrent Neural Networks (RNNs), and Generative Adversarial Networks (GANs), our system introduces an innovative approach to defect detection in manufacturing. This technology excels in…

The quality of industrial components is critical to the production of special equipment such as robots. Defect inspection of these components is an efficient way to ensure quality. In this paper, we propose a hybrid network, SSD-Faster Net,…

Post-processing algorithms play a key role in pushing the detection limits of high-contrast imaging (HCI) instruments. State-of-the-art image processing approaches for HCI enable the production of science-ready images relying on…

High-density LED arrays enable high-speed transmission in image-sensor-based visible-light communication (VLC) systems. However, when optical spots become blurred and spatially overlapped due to focal shift, resolution limitations, or…

The surface defect detection method based on visual perception has been widely used in industrial quality inspection. Because defect data are not easy to obtain and the annotation of a large number of defect data will waste a lot of…

It is a long-term goal to transfer biological processing principles as well as the power of human recognition into machine vision and engineering systems. One of such principles is visual attention, a smart human concept which focuses…

In the field of transmission electron microscopy, data interpretation often lags behind acquisition methods, as image processing methods often have to be manually tailored to individual datasets. Machine learning offers a promising approach…

With the rise of deep learning models in the field of computer vision, new possibilities for their application in industrial processes proves to return great benefits. Nevertheless, the actual fit of machine learning for highly standardised…

A method of scanning mid-IR-laser microscopy has recently been proposed for the investigation of large-scale electrically and recombination-active defects in semiconductors and non-destructive inspection of semiconductor materials and…

A method of the mid-IR-laser microscopy has been proposed for the investigation of the large-scale electrically and recombination active defects in semiconductors and non-destructive inspection of semiconductor materials and structures in…