相关论文: Single Event Effects Assessment of UltraScale+ MPS…

A single event upset (SEU) is a critical soft error that occurs in semiconductor devices on exposure to ionising particles from space environments. SEUs cause bit flips in the memory component of semiconductors. This creates a multitude of…

As the deployment of artifical intelligence (AI) algorithms at edge devices becomes increasingly prevalent, enhancing the robustness and reliability of autonomous AI-based perception and decision systems is becoming as relevant as precision…

This paper studies the dependability of the Xilinx Deep-Learning Processing Unit (DPU) under neutron irradiation. It analyses the impact of Single Event Effects (SEEs) on the accuracy of the DPU running the resnet50 model on a Xilinx…

Deep Neural Network (DNN) accelerators are extensively used to improve the computational efficiency of DNNs, but are prone to faults through Single-Event Upsets (SEUs). In this work, we present an in-depth analysis of the impact of SEUs on…

We present a multi-layer single-event upset mitigation strategy implemented in a low-cost Xilinx Artix-7 FPGA. The implementation is targeted for a trigger data router for the ATLAS muon spectrometer upgrade. The mitigation strategy employs…

With increasing aging problems of advanced technologies, in-field testing becomes an inevitable challenge, on top of the already demanding requirements, such as the ISO26262 for automotive safety. SOCs used in space, automotive or military…

Very deep submicron and nanometer technologies have increased notably integrated circuit (IC) sensitiveness to radiation. Soft errors are currently appearing into ICs working at earth surface. Hardened circuits are currently required in…

Neural Networks (NNs) are increasingly used in the last decade in several demanding applications, such as object detection and classification, autonomous driving, etc. Among different computing platforms for implementing NNs, FPGAs have…

Designing integrated circuits in radiation environments such as the High Luminosity LHC (HL-LHC) is challenging. Integrated circuits will be exposed to radiation-induced Single Event Effects (SEE). In deep sub-micron technology devices, the…

Deep neural networks (DNNs) are increasingly used in safety-critical applications. Reliable fault analysis and mitigation are essential to ensure their functionality in harsh environments that contain high radiation levels. This study…

Deep Neural Network has proved its potential in various perception tasks and hence become an appealing option for interpretation and data processing in security sensitive systems. However, security-sensitive systems demand not only high…

We present a first of its kind framework which overcomes a major challenge in the design of digital systems that are resilient to reliability failures: achieve desired resilience targets at minimal costs (energy, power, execution time,…

SRAM-based FPGAs are increasingly popular in the aerospace industry due to their field programmability and low cost. However, they suffer from cosmic radiation induced Single Event Upsets (SEUs). In safety-critical applications, the…

The deployment of machine learning (ML) models on microcontrollers (MCUs) is constrained by strict energy, latency, and memory requirements, particularly in battery-operated and real-time edge devices. While software-level optimizations…

Recent hardware acceleration advances have enabled powerful specialized accelerators for finite element computations, spiking neural network inference, and sparse tensor operations. However, existing approaches face fundamental limitations:…

Heavy ions induced single event upset (SEU) sensitivity of three-dimensional integrated SRAMs are evaluated by using Monte Carlo sumulation methods based on Geant4. The cross sections of SEUs and Multi Cell Upsets (MCUs) for 3D SRAM are…

Specialized hardware accelerators have been designed and employed to maximize the performance efficiency of Spiking Neural Networks (SNNs). However, such accelerators are vulnerable to transient faults (i.e., soft errors), which occur due…

As Neural Processing Units (NPU) or accelerators are increasingly deployed in a variety of applications including safety critical applications such as autonomous vehicle, and medical imaging, it is critical to understand the fault-tolerance…

The effects of soft errors in processor cores have been widely studied. However, little has been published about soft errors in uncore components, such as memory subsystem and I/O controllers, of a System-on-a-Chip (SoC). In this work, we…

The ever-expanding scale of integrated circuits has brought about a significant rise in the design risks associated with radiation-resistant integrated circuit chips. Traditional single-particle experimental methods, with their iterative…