相关论文: AFM-based Hamaker Constant Determination with Blin…

We consider the Casimir force including all important corrections to it for the configuration used in a recent experiment employing an atomic force microscope. We calculate the long-range hypothetical forces due to the exchange of light and…

Atomic Force Microscopy (AFM) is a widely employed tool for micro-/nanoscale topographic imaging. However, conventional AFM scanning struggles to reconstruct complex 3D micro-/nanostructures precisely due to limitations such as incomplete…

The radiation hardness of the AToM chips of the BaBar Silicon Vertex Tracker has been investigated by means of irradiations with photons from a 60Co source and 0.9 GeV electrons. The increase in noise and the decrease in gain of the…

We present a theoretical calculation of the changes in the Hamaker constant due to the anomalous reduction of the static dielectric function of water. Under confinement, the dielectric function of water decreases from a bulk value of 79…

Moving nanoparticles/atoms to study the nearfield interaction between them is one of the many approaches to explore the optical and electrical properties of these assemblies. Traditional approach included the self assembly by spinning or…

Investigating the polarization properties of light in the mid-infrared (mid-IR) spectrum is crucial for molecular sensing, biomedical diagnostics, and IR imaging system technologies. Traditional methods, limited by bulky size and intricate…

We present results of Niobium based SQUID magnetometers for which the weak-links are engineered by the local oxidation of thin films using an Atomic Force Microscope (AFM). Firstly, we show that this technique allows the creation of…

We demonstrate noncontact, high quality surface modification with spatial resolution of ~20 nm. The nanowriting is based on the interaction between the surface and the tip of an Atomic force microscope illuminated by a focused laser beam…

The absence of efficient light modulators for extreme ultraviolet (EUV) and X-ray photons significantly limits their real-life application, particularly when even slight complexity of the beam patterns is required. Here we report on a novel…

In the Aharonov-Albert-Vaidman (AAV) weak measurement, it is assumed that the measuring device or the pointer is in a quantum mechanical pure state. In reality, however, it is often not the case. In this paper, we generalize the AAV weak…

Directly imaging all atoms constituting a material and, maybe more importantly, crystalline defects that dictate materials' properties, remains a formidable challenge. Here, we propose a new approach to chemistry-sensitive field-ion…

$\beta$-Ga$_{2}$O$_{3}$ nanomembranes, obtained by ion-beam-assisted exfoliation, are used in the fabrication of simple metal-semiconductor-metal (MSM) structures, that are tested as photodetectors (PD) and field-effect transistors (FET).…

We discuss the influence of external forces on the motion of the tip in dynamic atomic force microscopy (AFM). First, a compact solution for the steady-state problem is derived employing a Fourier approach. Founding on this solution, we…

The Silicon Photomultiplier (SiPM) is a mature photodetector concept that is applied in a variety of applications ranging from medical imaging to automotive LiDAR systems. Over the last few years, improvements of the sensor performance are…

In-operando characterization of van der Waals (vdW) devices using surface-sensitive methods provides critical insights into phase transitions and correlated electronic states. Yet, integrating vdW materials in functional devices while…

Low-temperature scanning tunneling microscopy is used to probe, with atomic-scale spatial resolution, the intrinsic luminescence of a van der Waals heterostructure, made of a transition metal dichalcogenide monolayer stacked onto a…

In the present study we demonstrate for the first time how Astigmatism Particle Tracking Velocimetry (APTV) can be utilized to measure suspensions dynamics. Measurements were successfully performed in monodisperse, refractive index matched…

Tomographic volumetric additive manufacturing (VAM) achieves high print speed and design freedom by continuous volumetric light patterning. This differs from traditional vat photopolymerization techniques that use brief sequential (2D)…

Ultrasound Atomic Force Microscopy (US-AFM) has been used for subsurface imaging of nanostructures. The contact stiffness variations have been suggested as the origin of the image contrast. Therefore, to analyze the image contrast, the…

We present a detailed study of the interface morphology of an electro-deposited (ED) Ni/Cu bilayer film by using off-specular (diffuse) neutron reflectivity technique and Atomic Force Microscopy (AFM). The Ni/Cu bilayer has been…