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Next-generation heat-assisted magnetic recording (HAMR) relies on fast, localized heating of the magnetic medium during the write process. Au plasmonic near-field transducers are an attractive solution to this challenge, but increased…

High-impedance arc faults in AC power systems have the potential to lead to catastrophic accidents. However, significant challenges exist in identifying these faults because of the much weaker characteristics and variety when grounded with…

The first multi-color light curve analysis of the AH Mic binary system is presented. This system has very few past observations from the southern hemisphere. We extracted the minima times from the light curves based on the Markov Chain…

The design of an atomic force microscope with an all-fiber interferometric detection scheme capable of atomic resolution at about 500 mK is presented. The microscope body is connected to a small pumped 3He reservoir with a base temperature…

Wire media (WM) resonators have emerged as promising realization for plasma haloscopes -- devices designed to detect axions, a potential component of dark matter. Key factors influencing the detection probability include cavity volume,…

仪器与探测器 · 物理学 2025-08-07 Jim A. Enriquez , Rustam Balafendiev , Alexander J. Millar , Constantin Simovski , Pavel Belov

Microscopy such as Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) are essential tools in material imaging at micro- and nanoscale resolutions to extract physical knowledge and…

Scattering scanning near-field optical microscopy (s-SNOM) is a technique to enhance the spatial resolution, and when combined by Fourier transform spectroscopy it can provide spectroscopic information with high spatial resolution. This…

光学 · 物理学 2024-11-21 Soheil Khajavi , Ali Eghrari , Zahra Shaterzadeh-Yazdi , Mohammad Neshat

We experimentally investigated the contrast mechanism of infrared photoinduced force microscopy (PiFM) for recording vibrational resonances. Extensive experiments have demonstrated that spectroscopic contrast in PiFM is mediated by…

仪器与探测器 · 物理学 2020-12-02 Mohammad A. Almajhadi , Syed Mohammad Ashab Uddin , H. Kumar Wickramasinghe

HQM is an optical broad-band photometric monitoring program carried out since September 1988. We use a CCD camera at the MPIA 1.2$\,$m telescope. Fully automatic photometric reduction relative to stars in the frames is done within a few…

天体物理学 · 物理学 2007-05-23 K. -J. Schramm. U. Borgeest , D. Kühl , J. von Linde , M. D. Linnert , T. Schramm

The ability to perform broadband optical spectroscopy with sub-diffraction-limit resolution is highly sought-after for a wide range of critical applications. However, sophisticated tip-enhanced techniques are currently required to achieve…

Calculations of the photonic band structure, transmission coefficients, and quality factors of various two-dimensional, periodic and aperiodic, dielectric photonic crystals by using the finite element method (FEM) are reported. The…

介观与纳米尺度物理 · 物理学 2015-06-11 Imanol Andonegui , Angel J. Garcia-Adeva

Free floating Test Masses (TM) of inertial reference instruments accumulate charge mainly through the triboelectric effect during separation from their housings and, if in the space environment, from cosmic radiation. These charges will…

空间物理 · 物理学 2022-09-21 S. Wang , S. Saraf , J. Lipa , D. Yadav , S. Buchman

Atomic force microscopy-based nanoindentation (AFM-NI) enables characterization of the basic mechanical properties of wood pulp fibers in conditions representative of the state inside a paper sheet. Determination of the mechanical…

Fourier ptychographic microscopy (FPM) is a powerful computational imaging modality that achieves high space-bandwidth product imaging for biomedical samples. However, its adoption is limited by slow data acquisition due to the need for…

光学 · 物理学 2025-09-09 Shi Zhao , Haowen Zhou , Changhuei Yang

We present a method for extracting high-spatial resolution dielectric constant data at microwave frequencies. A scanning near field microwave microscope probes a sample and acquires data in the form of the frequency and quality factor…

材料科学 · 物理学 2009-09-22 Shuogang Huang , H. M. Christen , M. E. Reeves

The interaction of water with surfaces is crucially important in a wide range of natural and technological settings. In particular, at low temperatures, unveiling the atomistic structure of adsorbed water clusters would provide valuable…

材料科学 · 物理学 2024-02-23 F. Priante , N. Oinonen , Y. Tian , D. Guan , C. Xu , S. Cai , P. Liljeroth , Y. Jiang , A. S. Foster

Reconfigurable oxide nanoelectronics, enabled by conductive atomic force microscope (cAFM) lithography, have established complex oxide interfaces as a promising platform for quantum engineering that harnesses emergent phenomena for advanced…

Ambient operation poses a challenge to AFM because in contrast to operation in vacuum or liquid environments, the cantilever dynamics change dramatically from oscillating in air to oscillating in a hydration layer when probing the sample.…

介观与纳米尺度物理 · 物理学 2014-02-24 Daniel S. Wastl , Alfred J. Weymouth , Franz J. Giessibl

We assume that the sample height measured using AFM is reduced due to contact deformation. The Herz contact theory is applied for the quantitative description. General numerical solution is found. Analytical approximations for specific…

介观与纳米尺度物理 · 物理学 2011-07-22 M. O. Gallyamov , I. V. Yaminsky

Traction Force Microscopy (TFM) computes the forces exerted at the surface of an elastic material by measuring induced deformations in volume. It is used to determine the pattern of the adhesion forces exerted by cells or by cellular…

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