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This paper deals with the asymptotic behavior and FEM error analysis of a class of strongly damped wave equations using a semidiscrete finite element method in spatial directions combined with a finite difference scheme in the time…

数值分析 · 数学 2025-11-03 Krishan Kumar , P. Danumjaya , Anil Kumar , Amiya K. Pani

Pre-trained foundation models have demonstrated remarkable success in audio, vision and language, yet their potential for general machine signal modeling with arbitrary sampling rates-covering acoustic, vibration, and other industrial…

声音 · 计算机科学 2026-03-10 Yucong Zhang , Juan Liu , Ming Li

With continuous progression of Moore's Law, integrated circuit (IC) device complexity is also increasing. Scanning Electron Microscope (SEM) image based extensive defect inspection and accurate metrology extraction are two main challenges…

计算机视觉与模式识别 · 计算机科学 2023-08-17 Vic De Ridder , Bappaditya Dey , Sandip Halder , Bartel Van Waeyenberge

Topological defects play a key role in the structures and dynamics of liquid crystals (LCs) and other ordered systems. There is a recent interest in studying defects in different biological systems with distinct textures. However, a robust…

软凝聚态物质 · 物理学 2025-01-20 Haijie Ren , Weiqiang Wang , Wentao Tang , Rui Zhang

Ultrasonic testing is a common Non-Destructive Inspection (NDI) method used in aerospace manufacturing. However, the complexity and size of the ultrasonic scans make it challenging to identify defects through visual inspection or machine…

计算机视觉与模式识别 · 计算机科学 2025-01-27 Ashiqur Rahman , Venkata Devesh Reddy Seethi , Austin Yunker , Zachary Kral , Rajkumar Kettimuthu , Hamed Alhoori

Atomic-level imperfections play an increasingly critical role in nanophotonic device performance. However, it remains challenging to accurately characterize the sidewall roughness with sub-nanometer resolution and directly correlate this…

Nondestructive testing (NDT) is widely applied to defect identification of turbine components during manufacturing and operation. Operational efficiency is key for gas turbine OEM (Original Equipment Manufacturers). Automating the…

计算机视觉与模式识别 · 计算机科学 2022-08-10 Andrea Panizza , Szymon Tomasz Stefanek , Stefano Melacci , Giacomo Veneri , Marco Gori

Stereo depth estimation is error-prone; hence, effective error detection methods are desirable. Most such existing methods depend on characteristics of the stereo matching cost curve, making them unduly dependent on functional details of…

计算机视觉与模式识别 · 计算机科学 2017-11-29 Subhayan Mukherjee , Irene Cheng , Ram Mohana Reddy Guddeti , Anup Basu

Shallow nanoindentation enables mechanical characterization of thin films, individual phases and other volume-constrained materials, but measured hardness is often inflated by the indentation size effect (ISE), contact-area errors and…

材料科学 · 物理学 2026-05-01 Radmir Karamov , Tagir Karamov

This paper studies the problem of parameter estimation in resonant, acoustic fluid-structure interaction problems over a wide frequency range. Problems with multiple resonances are known to be subjected to local minima, which represents a…

计算物理 · 物理学 2019-03-06 Peter Göransson , Jacques Cuenca , Timo Lähivaara

We introduce a classical algorithm for sampling the output of shallow, noisy random circuits on two-dimensional qubit arrays. The algorithm builds on the recently-proposed "space-evolving block decimation" (SEBD) and extends it to the case…

量子物理 · 物理学 2023-11-16 Zihan Cheng , Matteo Ippoliti

Recently, parametric mappings have emerged as highly effective surface representations, yielding low reconstruction error. In particular, the latest works represent the target shape as an atlas of multiple mappings, which can closely encode…

计算机视觉与模式识别 · 计算机科学 2020-10-15 Zhantao Deng , Jan Bednařík , Mathieu Salzmann , Pascal Fua

Microstip antenna topology is commonly loaded with a narrow slot to manipulate the resonance frequency or impedance bandwidth. However, the tuning of the resonance frequency or impedance bandwidth results in the variation of the current and…

信号处理 · 电气工程与系统科学 2019-07-30 Sandip Ghosal , Arijit De , Raed M. Shubair , Ajay Chakrabarty

The association of scanning transmission electron microscopy (STEM) and the detection of a diffraction pattern at each probe position (so-called 4D-STEM) represents one of the most promising approaches to analyze structural properties of…

应用物理 · 物理学 2023-01-26 Leonardo Corrêa , Eduardo Ortega , Arturo Ponce , Mônica Cotta , Daniel Ugarte

Ocean eddies are swirling mesoscale features that play a fundamental role in oceanic transport and mixing. Eddy identification relies on diagnostic criteria that are inherently nonlinear functions of the flow variables. However, estimating…

地球物理 · 物理学 2025-10-06 Charlotte Moser , Nan Chen , Stephen Wiggins

Despite the impressive performance obtained by recent single-image hand modeling techniques, they lack the capability to capture sufficient details of the 3D hand mesh. This deficiency greatly limits their applications when high-fidelity…

计算机视觉与模式识别 · 计算机科学 2023-07-13 Tianyu Luan , Yuanhao Zhai , Jingjing Meng , Zhong Li , Zhang Chen , Yi Xu , Junsong Yuan

We study ground-penetrating synthetic aperture radar measurements of scattering by targets located below a rough air-soil interface. By considering the inherent space/angle limitations of this imaging modality, we introduce a simplified…

信号处理 · 电气工程与系统科学 2025-01-07 Arnold Kim , Chrysoula Tsogka

Here, we evaluate multislice electron ptychography as a tool to carry out depth-resolved atomic resolution characterization of point defects, using silicon carbide as a case study. Through multislice electron scattering simulations and…

材料科学 · 物理学 2025-05-15 Aaditya Bhat , Colin Gilgenbach , Junghwa Kim , Michael Xu , Menglin Zhu , James M. LeBeau

The multifrequency electrical impedance tomography consists in retrieving the conductivity distribution of a sample by injecting a finite number of currents with multiple frequencies. In this paper we consider the case where the…

数值分析 · 数学 2017-04-18 Habib Ammari , Faouzi Triki , Chun-Hsiang Tsou

Three-dimensional electron diffraction (3D ED) has emerged as a powerful method for solving the structures of sub-micron-sized particles down to nanoparticles. However, it faces technical challenges when applied to beam-sensitive samples or…