相关论文: Site-specific plan-view TEM lamella preparation of…

Needle-shaped atom probe specimens containing a single grain boundary were produced using the focused ion beam (FIB) of a dual-beam FIB/SEM (scanning electron microscope) system. The presented specimen preparation approach allows the…

Thermal sensing with fine spatial resolution is important to the study of many scientific areas. While modern microscopy systems allow easy optical detection at high spatial resolution, their intrinsic functions are mainly focused on…

In a scanning transmission electron microscope (STEM), producing a high-resolution image generally requires an electron beam focused to the smallest point possible. However, the magnetic lenses used to focus the beam are unavoidably…

Scanning electron microscopy (SEM) has been widely utilized in the field of materials science due to its significant advantages, such as large depth of field, wide field of view, and excellent stereoscopic imaging. However, at high…

Spatially separating electrons of different spins and efficiently generating spin currents are crucial steps towards building practical spintronics devices. Transverse magnetic focusing is a potential technique to accomplish both those…

The present study proposes a new approach to automated screening of Clinically Significant Macular Edema (CSME) and addresses two major challenges associated with such screenings, i.e., exudate segmentation and imbalanced datasets. The…

Electron and scanning probe microscopy produce vast amounts of data in the form of images or hyperspectral data, such as EELS or 4D STEM, that contain information on a wide range of structural, physical, and chemical properties of…

Limited-angle tomography is a highly ill-posed linear inverse problem. It arises in many applications, such as digital breast tomosynthesis. Reconstructions from limited-angle data typically suffer from severe stretching of features along…

We previously demonstrated near-field speckle scanning based x-ray imaging to be an easy-to-implement phase sensing method capable of providing both high sensitivity and high resolution. Yet, this performance combination could only be…

Recent efforts of multimodal Transformers have improved Visually Rich Document Understanding (VrDU) tasks via incorporating visual and textual information. However, existing approaches mainly focus on fine-grained elements such as words and…

We address the fundamental question of how to optimally probe a scene with electromagnetic (EM) radiation to yield a maximum amount of information relevant to a particular task. Machine learning (ML) techniques have emerged as powerful…

(Scanning) transmission electron microscopy ((S)TEM) has significantly advanced materials science but faces challenges in correlating precise atomic structure information with the functional properties of devices due to its time-intensive…

Electroluminescence (EL) imaging is a powerful and established technique for assessing the quality of photovoltaic (PV) modules, which consist of many electrically connected solar cells arranged in a grid. The analysis of imperfect…

Scanning electron microscopy (SEM), a century-old technique, is today a ubiquitous method of imaging the surface of nanostructures. However, most SEM detectors simply count the number of secondary electrons from a material of interest, and…

Discrete tomography is a well-established method to investigate finite point sets, in particular finite subsets of periodic systems. Here, we start to develop an efficient approach for the treatment of finite subsets of mathematical…

Scientific visualization tools tend to be flexible in some ways (e.g., for exploring isovalues) while restricted in other ways, such as working only on regular grids, or only on unstructured meshes (as used in the finite element method,…

Seeing clearly with high resolution is a foundation of Large Multimodal Models (LMMs), which has been proven to be vital for visual perception and reasoning. Existing works usually employ a straightforward resolution upscaling method, where…

Quantification of microstructures is crucial for understanding processing-structure and structure-property relationships in polycrystalline materials. Delineating grain boundaries in bright-field transmission electron micrographs, however,…

Instrumentation developments in electron energy-loss spectroscopy (EELS) in the scanning transmission electron microscope (STEM) one decade ago paved the way for combining milli-electronvolt energy resolution in spectroscopy with…

Characterizing materials using electron micrographs is crucial in areas such as semiconductors and quantum materials. Traditional classification methods falter due to the intricatestructures of these micrographs. This study introduces an…