相关论文: Development of a Practicable Digital Pulse Read-ou…
The near-field diffraction of fs and sub-fs light pulses by nm-size slit-type apertures and its implication for near-field scanning optical microscopy (NSOM) is analyzed. The amplitude distributions of the diffracted wave-packets having the…
While transmission electron microscopes (TEM) can achieve a much higher resolution than optical microscopes, they face challenges of damage to samples during the high energy processes involved. Here, we explore using computational ghost…
Quasi-two-dimensional (quasi-2D) materials hold promise for future electronics because of their unique band structures that result in electronic and mechanical properties sensitive to crystal strains in all three dimensions. Quantifying…
The state of the art method for fingerprinting digital cameras focuses on the non-uniform output of an array of photodiodes due to the distinct construction of the PN junction when excited by photons. This photo-response non-uniformity…
Resonant absorption imaging is a common technique for detecting the two-dimensional column density of ultracold atom systems. In many cases, the system's thickness along the imaging direction greatly exceeds the imaging system's depth of…
Electrons in atoms and molecules move on attosecond time scales. Deciphering their quantum dynamics in space and time calls for high-resolution microscopy at this speed. While scanning tunnelling microscopy (STM) driven with terahertz…
Refraction of an optical probe beam by a plasma can be measured with angular filter refractometry (AFR), which produces an image containing intensity contours that correspond to curves of constant refraction angle. Further analysis is…
We present a technique for atomic density measurements by the off-resonant phase-shift induced on a two-frequency, coherently-synthesised light beam. We have used this scheme to measure the column density of a magnetically trapped atom…
Time-frequency (TF) representation of non-stationary signals typically requires the effective concentration of energy distribution along the instantaneous frequency (IF) ridge, which exhibits intrinsic sparsity. Inspired by the sparse…
The neutron time-of-flight facility n_TOF at CERN is a spallation source dedicated to measurements of neutron-induced reaction cross-sections of interest in nuclear technologies, astrophysics, and other applications. Since 2014,…
Ultrafast electron pulses, combined with laser-pump and electron-probe technologies, allow for various forms of ultrafast microscopy and spectroscopy to elucidate otherwise challenging to observe physical and chemical transitions. However,…
The increasing use of two-dimensional (2D) materials in nanoelectronics demands robust metrology techniques for electrical characterization, especially for large-scale production. While atomic force microscopy (AFM) techniques like…
Recording of transient absorption microscopy images requires fast detection of minute optical density changes, which is typically achieved with high-repetition-rate laser sources and lock-in detection. Here, we present a highly flexible and…
Transmission electron microscopy (TEM) is carried out in vacuum to minimize the interaction of the imaging electrons with gas molecules while passing through the microscope column. Nevertheless, in typical devices, the pressure remains at…
Resistive Pulse Sensing (RPS) is a key label-free technology to measure particles and single-cell size distribution. As a growing corpus of evidence supports that cancer cells exhibit distinct mechanical phenotypes from healthy cells,…
We demonstrate a multi-beam scanning transmission electron microscopy (STEM) imaging that integrates down-sampling with super-resolution image reconstruction via a compressive sensing framework. A custom condenser aperture with six randomly…
Tilt-corrected imaging methods in four-dimensional scanning transmission electron microscopy (4D-STEM) have recently emerged as a new class of direct ptychography methods that are especially useful at low dose. The operation of tilt…
Dark field X-ray microscopy (DXFM) can visualize microstructural distortions in bulk crystals. Using the femtosecond X-ray pulses generated by X-ray free-electron lasers (XFEL), DFXM can achieve sub-{\mu}m spatial resolution and <100 fs…
Image simulation for scanning transmission electron microscopy at atomic resolution for samples with realistic dimensions can require very large computation times using existing simulation algorithms. We present a new algorithm named PRISM…
We present a new method of DEEM, the direct energy encircling method, for characterising the performance of fibres in most astronomical spectroscopic applications. It's a versatile platform to measure focal ratio degradation (FRD),…