相关论文: A novel direct structured-light inspection techniq…
We present a differentiable framework to adaptively compute 4D illumination conditions with respect to an object, for efficient, high-quality simultaneous acquisition of its shape and reflectance, with a unified spatial-angular structured…
Industrial defect detection is vital for upholding product quality across contemporary manufacturing systems. As the expectations for precision, automation, and scalability intensify, conventional inspection approaches are increasingly…
We present a computational imaging technique for imaging thin films at grazing-incidence (GI) angles by incorporating structured illumination into existing GI X-ray scattering setups. This method involves scanning a micro-coded aperture…
Recent work has shown that diffusion models can serve as powerful neural rendering engines that can be leveraged for inserting virtual objects into images. However, unlike typical physics-based renderers, these neural rendering engines are…
This paper describes a prototype software and hardware platform to provide support to field operators during the inspection of surface defects of non-metallic pipes. Inspection is carried out by video filming defects created on the same…
Gaussian Splatting has become a popular technique for various 3D Computer Vision tasks, including novel view synthesis, scene reconstruction, and dynamic scene rendering. However, the challenge of natural-looking object insertion, where the…
Optical spectroscopy techniques such as differential reflectance and transmittance have proven to be very powerful techniques to study 2D materials. However, a thorough description of the experimental setups needed to carry out these…
Though structured illumination (SI) microscopy is a popular imaging technique conventionally associated with fluorescent super-resolution, recent works have suggested its applicability towards sub-diffraction coherent imaging with…
In this work, we present STOPNet, a framework for 6-DoF object suction detection on production lines, with a focus on but not limited to transparent objects, which is an important and challenging problem in robotic systems and modern…
A method of the mid-IR-laser microscopy has been proposed for the investigation of the large-scale electrically and recombination active defects in semiconductors and non-destructive inspection of semiconductor materials and structures in…
In this article, a new scanning electron microscopy (SEM) image composition technique is described, which can significantly reduce drift related image corruptions. Drift-distortion commonly causes blur and distortions in the SEM images.…
We develop a method that recovers the surface, materials, and illumination of a scene from its posed multi-view images. In contrast to prior work, it does not require any additional data and can handle glossy objects or bright lighting. It…
This work introduces a novel reinterpretation of structured illumination (SI) microscopy for coherent imaging that allows three-dimensional imaging of complex refractive index (RI). To do so, we show that coherent SI is mathematically…
Structural colors can be induced on metals not only to fabricate logos or decorative motives but also to embed anti-counterfeit features for product protection. In this study, stainless steel (EN 1.4301) plates are colorized by growing a…
Crack detection is of great significance for monitoring the integrity and well-being of the infrastructure such as bridges and underground pipelines, which are harsh environments for people to access. In recent years, computer vision…
The use of fast pixelated detectors and direct electron detection technology is revolutionising many aspects of scanning transmission electron microscopy (STEM). The widespread adoption of these new technologies is impeded by the technical…
Being able to see beyond the direct line of sight is an intriguing prospective and could benefit a wide variety of important applications. Recent work has demonstrated that time-resolved measurements of indirect diffuse light contain…
We have developed a light scattering technique based on differential measurement and polarization (differential light scattering, DLS) capable in principle of retrieving timing information with picosecond resolution without the need for…
This paper presents a method to detect reflection of 3D light detection and ranging (Lidar) scans and uses it to classify the points and also map objects outside the line of sight. Our software uses several approaches to analyze the point…
Scattering-based single-particle tracking (S-SPT) has opened new avenues for highly sensitive label-free detection and characterization of nanoscopic objects, making it particularly attractive for various analytical applications. However, a…