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相关论文: Blockwise Based Detection of Local Defects

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The unsupervised visual inspection of defects in industrial products poses a significant challenge due to substantial variations in product surfaces. Current unsupervised models struggle to strike a balance between detecting texture and…

计算机视觉与模式识别 · 计算机科学 2023-11-22 Peng Wang , Haiming Yao , Wenyong Yu

One important characteristic of modern fault classification systems is the ability to flag the system when faced with previously unseen fault types. This work considers the unknown fault detection capabilities of deep neural network-based…

机器学习 · 计算机科学 2024-03-27 Nurettin Sergin , Jiayu Huang , Tzyy-Shuh Chang , Hao Yan

Defect detection is a basic and essential task in automatic parts production, especially for automotive engine precision parts. In this paper, we propose a new idea to construct a deep convolutional network combining related knowledge of…

计算机视觉与模式识别 · 计算机科学 2018-10-30 Zhenshen Qu , Jianxiong Shen , Ruikun Li , Junyu Liu , Qiuyu Guan

Anomaly Detection and Segmentation (AD&S) is crucial for industrial quality control. While existing methods excel in generating anomaly scores for each pixel, practical applications require producing a binary segmentation to identify…

计算机视觉与模式识别 · 计算机科学 2024-04-08 Alex Costanzino , Pierluigi Zama Ramirez , Mirko Del Moro , Agostino Aiezzo , Giuseppe Lisanti , Samuele Salti , Luigi Di Stefano

Text spotting has seen tremendous progress in recent years yielding performant techniques which can extract text at the character, word or line level. However, extracting blocks of text from images (block-level text spotting) is relatively…

计算机视觉与模式识别 · 计算机科学 2024-06-21 Ganesh Bannur , Bharadwaj Amrutur

In garment manufacturing, an automatic sewing machine is desirable to reduce cost. To accomplish this, a high speed vision system is required to track fabric motions and recognize repetitive weave patterns with high accuracy, from a micro…

图像与视频处理 · 电气工程与系统科学 2018-12-12 Yuting Hu , Zhiling Long , Ghassan AlRegib

This paper presents an improved edge detection algorithm for facial and remotely sensed images using vector order statistics. The developed algorithm processes colored images directly without been converted to gray scale. A number of the…

计算机视觉与模式识别 · 计算机科学 2015-03-20 B O. Sadiq , S. M. Sani , S. Garba

In this paper, we propose an efficient approach for industrial defect detection that is modeled based on anomaly detection using point pattern data. Most recent works use \textit{global features} for feature extraction to summarize image…

计算机视觉与模式识别 · 计算机科学 2021-08-30 Ammar Mansoor Kamoona , Amirali Khodadadian Gostar , Alireza Bab-Hadiashar , Reza Hoseinnezhad

The paper presents a simple and effective learning-based method for computing a discriminative 3D point cloud descriptor for place recognition purposes. Recent state-of-the-art methods have relatively complex architectures such as…

计算机视觉与模式识别 · 计算机科学 2022-04-11 Jacek Komorowski

License Plate recognition plays an important role on the traffic monitoring and parking management systems. In this paper, a fast and real time method has been proposed which has an appropriate application to find tilt and poor quality…

计算机视觉与模式识别 · 计算机科学 2014-07-25 Reza Azad , Hamid Reza Shayegh

Previous works for PCB defect detection based on image difference and image processing techniques have already achieved promising performance. However, they sometimes fall short because of the unaccounted defect patterns or over-sensitivity…

计算机视觉与模式识别 · 计算机科学 2019-02-19 Sanli Tang , Fan He , Xiaolin Huang , Jie Yang

Visual defect detection is critical to ensure the quality of most products. However, the majority of small and medium-sized manufacturing enterprises still rely on tedious and error-prone human manual inspection. The main reasons include:…

计算机视觉与模式识别 · 计算机科学 2022-02-15 Zijian Kuang , Xinran Tie , Lihang Ying , Shi Jin

Defect predictors, static bug detectors and humans inspecting the code can locate the parts of the program that are buggy before they are discovered through testing. Automated test generators such as search-based software testing (SBST)…

软件工程 · 计算机科学 2021-10-07 Anjana Perera , Burak Turhan , Aldeida Aleti , Marcel Böhme

Automatic defect recognition is one of the research hotspots in steel production, but most of the current methods mainly extract features manually and use machine learning classifiers to recognize defects, which cannot tackle the situation,…

计算机视觉与模式识别 · 计算机科学 2019-09-18 Jingwen Fu , Xiaoyan Zhu , Yingbin Li

Fault localization has been determined as a major resource factor in the software development life cycle. Academic fault localization techniques are mostly unknown and unused in professional environments. Although manual debugging…

软件工程 · 计算机科学 2021-03-04 Thomas Hirsch

Binary classification problems can be naturally modeled as bipartite graphs, where we attempt to classify right nodes based on their left adjacencies. We consider the case of labeled bipartite graphs in which some labels and edges are not…

组合数学 · 数学 2018-11-13 R. W. R. Darling , Mark L. Velednitsky

The defect morphology is an essential aspect of the evolution of crystals' microstructure and its response to stress. Existing methods either only report defect concentration or characterize only some of the defect morphologies. The need…

计算物理 · 物理学 2021-04-21 Utkarsh Bhardwaj , Andrea E. Sand , Manoj Warrier

Recent years have witnessed many advancements in the applications of 3D textured meshes. As the demand continues to rise, evaluating the perceptual quality of this new type of media content becomes crucial for quality assurance and…

计算机视觉与模式识别 · 计算机科学 2024-05-13 Armin Shafiee Sarvestani , Wei Zhou , Zhou Wang

Existing position based point cloud filtering methods can hardly preserve sharp geometric features. In this paper, we rethink point cloud filtering from a non-learning non-local non-normal perspective, and propose a novel position based…

计算机视觉与模式识别 · 计算机科学 2021-10-15 Jinxi Wang , Jincen Jiang , Xuequan Lu , Meili Wang

Statistical quality control in semiconductor manufacturing hinges on effective diagnostics of wafer bin maps, wherein a key challenge is to detect how defective chips tend to spatially cluster on a wafer--a problem known as spatial pattern…

应用统计 · 统计学 2021-03-01 Ahmed Aziz Ezzat , Sheng Liu , Dorit S. Hochbaum , Yu Ding