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It is thought that growing large, oriented grains of perovskite can lead to more efficient devices. We study MAPbI3 films fabricated via Flash Infrared Annealing (FIRA) consisting of highly oriented, large grains. Domains observed in the…

Ferroelectric materials exhibit a switchable, spontaneous polarization at the unit cell level--an attractive property utilized in many emerging technologies including, among others, high-density memory storage, low-power transistors, and…

材料科学 · 物理学 2026-01-15 Claire Griesbach , Tizian Scharsach , Morgan Trassin , Dennis M. Kochmann

Microstructure characterisation has been greatly enhanced through the use of electron backscatter diffraction (EBSD), where rich maps are generated through analysis of the crystal phase and orientation in the scanning electron microscope…

材料科学 · 物理学 2018-11-15 Vivian S Tong , Alexander J Knowles , David Dye , T Ben Britton

Materials characterization using electron backscatter diffraction (EBSD) requires indexing the orientation of the measured region from Kikuchi patterns. The quality of Kikuchi patterns can degrade due to pattern overlaps arising from two or…

材料科学 · 物理学 2024-06-07 Ashish Chauniyal , Pascal Thome , Markus Stricker

Precise and accurate determination of crystallographic orientation is crucial for engineering van der Waals heterostructures, where the twist angle between layers controls emergent electronic and optical properties. While Electron…

材料科学 · 物理学 2026-03-11 R. Bangari , M. Mosayebi , J. Buchner , J. D. Caldwell , N. Bassim , T. G. Folland

Electron backscatter diffraction (EBSD) is a well-established method of characterisation for crystalline materials. This technique can rapidly acquire and index diffraction patterns to provide phase and orientation information about the…

材料科学 · 物理学 2019-09-04 Alexander Foden , David Collins , Angus Wilkinson , Thomas Benjamin Britton

Halide perovskites are promising semiconductors for inexpensive, high-performance optoelectronics. Despite a remarkable defect tolerance compared to conventional semiconductors, perovskite thin films still show substantial microscale…

Bragg coherent X-ray diffraction imaging (BCDI) allows the three-dimensional (3D) measurement of lattice strain along the scattering vector for specific microcrystals. If at least three linearly independent reflections are measured, the 3D…

Using nanoprobe X-ray diffraction microscopy, we investigate the relationship between residual strains from crystal growth in CsPbBr$_3$ thin film crystals, their stability, and local bandgap. We find that out-of-plane compressive strain…

材料科学 · 物理学 2018-11-29 Xueying Li , Yanqi Luo , Martin Holt , Zhonghou Cai , David P. Fenning

We present a few recent developments in the field of electron backscatter diffraction (EBSD). We highlight how open source algorithms and open data formats can be used to rapidly to develop microstructural insight of materials. We include…

计算物理 · 物理学 2019-08-15 Alex Foden , Alessandro Previero , Thomas Benjamin Britton

For high (angular) resolution electron backscatter diffraction (HR-EBSD), the selection of a reference diffraction pattern (EBSP0) significantly affects the precision of the calculated strain and rotation maps. This effect was demonstrated…

材料科学 · 物理学 2023-02-21 Abdalrhaman Koko , Vivian Tong , Angus J. Wilkinson , T. James Marrow

Orientation determination does not necessarily require complete knowledge of the local atomic arrangement in a material. We present a method for microstructural phase discrimination and orientation analysis of phases for which there is only…

材料科学 · 物理学 2019-06-06 Aimo Winkelmann , Grzegorz Cios , Tomasz Tokarski , Gert Nolze , Ralf Hielscher , Tomasz Kocieł

In materials science and particularly electron microscopy, Electron Back-scatter Diffraction (EBSD) is a common and powerful mapping technique for collecting local crystallographic data at the sub-micron scale. The quality of the…

计算机视觉与模式识别 · 计算机科学 2019-03-08 Florian Strub , Marie-Agathe Charpagne , Tresa M. Pollock

Pattern matching approaches to electron backscatter diffraction (EBSD) in the scanning electron microscope (SEM) provide qualitatively new possibilities for the microstructural analysis of chiral non-centrosymmetric phases due to the…

材料科学 · 物理学 2025-01-16 Grzegorz Cios , Aimo Winkelmann , Tomasz Tokarski , Piotr Bała

The locally varying tetragonality in martensite grains of a high-carbon steel (1.2 mass percent C) was resolved by electron backscatter diffraction (EBSD) with a spatial resolution in the order of 100nm. Compared to spatially integrating…

材料科学 · 物理学 2020-11-23 Gert Nolze , Aimo Winkelmann , Grzegorz Cios , Tomasz Tokarski

Electron backscatter diffraction (EBSD) is a technique used to measure crystallographic features in the scanning electron microscope. The technique is highly automated and readily accessible in many laboratories. EBSD pattern indexing is…

计算物理 · 物理学 2018-07-18 Thomas Benjamin Britton , Vivian Tong , Jim Hickey , Alex Foden , Angus Wilkinson

Accurately determining the crystallographic structure of a material, organic or inorganic, is a critical primary step in material development and analysis. The most common practices involve analysis of diffraction patterns produced in…

We describe a lattice-based crystallographic approximation for the analysis of distorted crystal structures via Electron Backscatter Diffraction (EBSD) in the scanning electron microscope. EBSD patterns are closely linked to local lattice…

材料科学 · 物理学 2019-01-02 Aimo Winkelmann , Gert Nolze , Grzegorz Cios , Tomasz Tokarski

Organic-inorganic perovskite solar cells have attracted tremendous attention because of their remarkably high power conversion efficiencies (PCEs). To further improve the device performance, however, it is imperative to obtain fundamental…

材料科学 · 物理学 2018-02-07 Zhaodong Chu , Mengjin Yang , Philip Schulz , Di Wu , Xin Ma , Edward Seifert , Liuyang Sun , Kai Zhu , Xiaoqin Li , Keji Lai

Pattern matching between target electron backscatter patterns (EBSPs) and dynamically simulated EBSPs was used to determine the pattern centre (PC) and crystal orientation, using a global optimisation algorithm. Systematic analysis of error…

材料科学 · 物理学 2019-04-16 Tomohito Tanaka , Angus J. Wilkinson
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