相关论文: Monte Carlo modeling of low-energy electron-induce…

Secondary electron emission (SEE) from inner linings of plasma chambers in electric thrusters for space propulsion can have a disruptive effect on device performance and efficiency. SEE is typically calculated using elastic and inelastic…

We present calculations of secondary electron emission (SEE) yields in tungsten as a function of primary electron energies between 50 eV and 1 keV and incidence angles between 0 and 90{\deg}. We conduct a review of the established Monte…

It is found that for objects possessing small surface structures with differing radii of curvature the secondary electron emission (SEE) yield may be significantly higher than for objects with smooth surfaces of the same material. The…

Electron transport within nanostructures can be important to varied engineering applications, such as thermoelectrics and nanoelectronics. In theoretical studies, electron Monte Carlo simulations are widely used as an alternative approach…

Secondary electron emission (SEE) from solids plays an important role in many areas of science and technology.1 In recent years, there has been renewed interest in the experimental and theoretical studies of SEE. A recent study proposed…

In particle accelerators, the build-up of electron cloud may have important influence on beam quality. Especially for the positron and proton accelerators, massive electrons lead to electron cloud, which affects the stability, energy,…

We introduce a new Monte Carlo model based on a semi-empirical sputter yield parameter in ion-solid energetic collisions. This model circumvents the complexity of the existing statistical, classical and continuum models, most of which are…

In high power RF devices for space, secondary electron emission appears as the main parameter governing the multipactor effect and as well as the e-cloud in large accelerators. Critical experimental activities included development of…

Secondary electron (SE) imaging techniques, such as scanning electron microscopy and helium ion microscopy (HIM), use electrons emitted by a sample in response to a focused beam of charged particles incident at a grid of raster scan…

The effect of doping in Si3N4 membranes on the secondary electron yield is investigated using Monte Carlo simulations of the electron-matter interactions. The effect of the doping level of silicon doping and the effect of the distribution…

Processes of the secondary electron emission (SEE) from the walls are included into the Numerical Advanced Model of Electron Cyclotron Resonance Ion Sources (NAM-ECRIS). It is found that SEE strongly influences electron confinement time and…

We investigate the dependence of the yield of positive secondary ions created upon impact of primary He, B and Ne ions on geometry and electronic and nuclear energy deposition by the projectiles. We employ pulsed beams in the medium energy…

Over the past decade, experimental microscopy and spectroscopy have made significant progress in the study of the morphological, optical, electronic and transport properties of materials. These developments include higher spatial…

Laser surface structuring has proven to be an effective technique for achieving a copper surface with secondary electron yield (SEY) values close to or below unity. However, the attributes that minimize SEY, such as moderately deep grooves…

The effect of rough structures on the electron emission under electron impact between 10 eV and 2 keV is investigated with a new version of the low energy electromagnetic model of GEANT4 (MicroElec). The inelastic scattering is modeled,…

We present a numerical investigation of energy and charge distributions during electron-beam-induced growth of W nanostructures on SiO2 substrates using Monte Carlo simulation of electron transport. This study gives a quantitative insight…

A one dimensional Vlasov Poisson simulation code is employed to investigate the plasma sheath considering electron induced secondary electron emission (SEE) and backscattering. The SEE coefficient is commonly treated as constant in a range…

Secondary electron (SE) imaging offers a powerful complementary capabilities to conventional scanning transmission electron microscopy (STEM) by providing surface-sensitive, pseudo-3D topographic information. However, contrast…

Positron annihilation lifetime spectroscopy (PALS) and positron-electron momentum density (PEMD) studies on multilayers of PbSe nanocrystals (NCs), supported by transmission electron microscopy (TEM), show that positrons are strongly…

The thickness and interfacial geometry of hexagonal boron nitride (hBN) films grown by chemical vapor deposition on polycrystalline nickel foils is studied using low-energy electron microscopy (LEEM). The reflectivity of the electrons,…