相关论文: A least-squares functional for joint exit wave rec…
A method is described for the reconstruction of the amplitude and phase of the object exit wave function by phase-plate transmission electron microscopy. The proposed method can be considered as in-line holography and requires three images,…
Transmission Electron Microscopy enables high-resolution imaging of materials, but the resulting images are difficult to interpret directly. One way to address this is exit wave reconstruction, i.e., the recovery of the complex-valued…
Transmission electron microscopes (TEMs) enable atomic-scale imaging but suffer from aberrations caused by lens imperfections and environmental conditions, reducing image quality. These aberrations can be compensated by adjusting…
Electron microscopy has enabled many scientific breakthroughs across multiple fields. A key challenge is the tuning of microscope parameters based on images to overcome optical aberrations that deteriorate image quality. This calibration…
Recovering corrupted images is one of the most challenging problems in image processing. Among various restoration tasks, blind image deblurring has been extensively studied due to its practical importance and inherent difficulty. In this…
In the context of optical interferometry, only undersampled power spectrum and bispectrum data are accessible. It poses an ill-posed inverse problem for image recovery. Recently, a tri-linear model was proposed for monochromatic imaging,…
With the advent of infrared long-baseline interferometers with more than two telescopes, both the size and the completeness of interferometric data sets have significantly increased, allowing images based on models with no a priori…
Reconstruction of the exit wave function is an important route to interpreting high-resolution transmission electron microscopy (HRTEM) images. Here we demonstrate that convolutional neural networks can be used to reconstruct the exit wave…
A major challenge in single particle reconstruction from cryo-electron microscopy is to establish a reliable ab-initio three-dimensional model using two-dimensional projection images with unknown orientations. Common-lines based methods…
Tomographic wave-front reconstruction is the main computational bottleneck to realize real-time correction for turbulence-induced wave-front aberrations in future laser-assisted tomographic adaptive-optics (AO) systems for ground-based…
State-of-the-art electron microscopes such as scanning electron microscopes (SEM), scanning transmission electron microscopes (STEM) and transmission electron microscopes (TEM) have become increasingly sophisticated. However, the quality of…
Nowadays, modern electron microscopes deliver images at atomic scale. The precise atomic structure encodes information about material properties. Thus, an important ingredient in the image analysis is to locate the centers of the atoms…
Alternative reconstruction method is proposed on retrieving the object exit wave function (OEW) directly from the recorded image intensity pattern in high resolution transmission electron microscopy (HRTEM). The method is based on applying…
In this paper, the multiple-input multiple-output (MIMO) transmit beampattern matching problem is considered. The problem is formulated to approximate a desired transmit beampattern (i.e., an energy distribution in space and frequency) and…
In electrical impedance tomography, algorithms based on minimizing a linearized residual functional have been widely used due to their flexibility and good performance in practice. However, no rigorous convergence results have been…
This work addresses the recovery and demixing problem of signals that are sparse in some general dictionary. Involved applications include source separation, image inpainting, super-resolution, and restoration of signals corrupted by…
Limited-angle electron tomography aims to reconstruct 3D shapes from 2D projections of Transmission Electron Microscopy (TEM) within a restricted range and number of tilting angles, but it suffers from the missing-wedge problem that causes…
Sparse channel estimation for massive multiple-input multiple-output systems has drawn much attention in recent years. The required pilots are substantially reduced when the sparse channel state vectors can be reconstructed from a few…
Aberration-corrected Scanning Transmission Electron Microscopy (STEM) has become an essential tool in understanding materials at the atomic scale. However, tuning the aberration corrector to produce a sub-{\AA}ngstr\"om probe is a complex…
Electron microscopy has shown to be a very powerful tool to map the chemical nature of samples at various scales down to atomic resolution. However, many samples can not be analyzed with an acceptable signal-to-noise ratio because of the…