相关论文: Atomic force microscopy study of the surface degra…
A recent report [S. Deville et al., J. Am. Ceram. Soc., 86(12), 2225 (2003)] has shown the new possibilities offered by atomic force microscopy (AFM) to investigate martensitic transformation induced relief in zirconia. In this paper, we…
The tetragonal to monoclinic (t-m) phase transformation of zirconia has been the object of extensive investigations of the last twenty years, and is now recognised as being of martensitic nature. However, martensitic transformation has only…
We investigate by atomic force microscopy (AFM) the surface relief resulting from martensitic tetragonal to monoclinic phase transformation induced by low temperature autoclave aging in ceria-stabilized zirconia. AFM appears as a very…
We demonstrate in this paper that atomic force microscopy can be successfully used to gain further insights into the understanding of transformation toughening in ceria stabilized zirconia. Transformation was induced by stresses accumulated…
The tetragonal to monoclinic phase transformation of zirconia has been the subject of extensive studies over the last 20 years [1-4]. The main features of the transformation have been identified and its martensitic nature is now widely…
Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable…
Though the martensitic transformation in zirconia has been the object of a very large number of studies for the last decades, qualitative and quantitative observations of the formation and growth of relief induced by low temperature…
Yttria-stabilized tetragonal zirconia polycrystals (3Y-TZP) with different microstructures were elaborated. The isothermal tetragonal to monoclinic transformation was investigated at 134 {\deg}C in steam by X-ray diffraction, Atomic Force…
Detection of dynamic surface displacements associated with local changes in material strain provides access to a number of phenomena and material properties. Contact resonance-enhanced methods of Atomic Force Microscopy (AFM) have been…
Atomic force microscopy (AFM) enables high-resolution imaging and quantitative force measurement, which is critical for understanding nanoscale mechanical, chemical, and biological interactions. In dynamic AFM modes, however, interaction…
Atomic Force Microscopy (AFM) allows to reconstruct the topography of surface with a resolution in the nanometer range. The exceptional resolution attainable with the AFM makes this instrument a key tool in nanoscience and technology. The…
General energy approaches have been applied to study the single-domain polarization reversal induced by the voltage-modulated Atomic Force Microscopy (AFM) in ferroelectric single crystals and thin films. Topographic analysis of energy…
We propose a new method to investigate interactions involved in atomic force microscopy (AFM). It is a dynamical method relying on the growth of oscillations via parametric resonance. With this method the second and third derivatives of the…
Atomic Force Microscopy (AFM) has become established as a powerful and a versatile tool for investigating local mechanical properties. In addition, it has been made possible to take advantage of the AFM tip-sample interaction, to perturb,…
Atomic force microscopy (AFM) is a well-known tool for studying surface roughness and to collect depth information about features on the top atomic layer of samples. By combining secondary ion mass spectroscopy (SIMS) with focused ion beam…
The low temperature autoclave aging behavior of zirconia toughened alumina composites processed by a classical powder mixing processing route was analyzed using atomic force microscopy (AFM), scanning electron microscopy and X-Ray…
Atomic Force Microscopy (AFM) allows to probe matter at atomic scale by measuring the perturbation of a nanomechanical oscillator induced by near-field interaction forces. The quest to improve sensitivity and resolution of AFM has forced…
Zirconium (Zr) is an important engineering material with numerous practical applications. It undergoes martensitic $\alpha$ to $\omega$ phase transformation (PT) at pressures that vary from 0.67 GPa to 17 GPa under different loading…
Intercalation of two dimensional materials, particularly transition metal dichalcogenides, is a noninvasive way to modify electronic, optical and structural properties of these materials. However, research of these atomic-scale phenomena…
Since the invention of the atomic force microscope (AFM) in 1986, there has been a drive to apply this scanning probe technique or a form of this technique to various disciplines in nanoscale science. Magnetic force microscopy (MFM) is a…