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相关论文: Analysis of STM images with pure and CO-functional…

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We present a method capable of calculating elastic scanning tunneling microscopy (STM) currents from localized atomic orbital density functional theory (DFT). To overcome the poor accuracy of the localized orbital description of the wave…

介观与纳米尺度物理 · 物理学 2018-09-14 Alexander Gustafsson , Magnus Paulsson

High resolution Atomic Force Microscopy (AFM) and Scanning Tunnelling Microscopy (STM) imaging with functionalized tips is well established, but a detailed understanding of the imaging mechanism is still missing. We present a numerical…

介观与纳米尺度物理 · 物理学 2014-08-27 Prokop Hapala , Georgy Kichin , Christian Wagner , F. Stefan Tautz , Ruslan Temirov , Pavel Jelinek

We present a method used to intuitively interpret the STM contrast by investigating individual wave functions originating from the substrate and tip side. We use localized basis orbital density functional theory, and propagate the wave…

介观与纳米尺度物理 · 物理学 2018-09-14 Alexander Gustafsson , Magnus Paulsson

We present a very efficient and accurate method to simulate scanning tunneling microscopy images and spectra from first-principles density functional calculations. The wave-functions of the tip and sample are calculated separately on the…

材料科学 · 物理学 2016-08-16 Óscar Paz , Iván Brihuega , José M. Gómez-Rodríguez , José M. Soler

Based on Bardeen's perturbative approach to tunneling, we have found an expression for the current between tip and sample, which can be efficiently coded in order to perform fast ab initio simulations of STM images. Under the observation…

材料科学 · 物理学 2007-05-23 Oscar Paz , Jose M. Soler

The simultaneous combination of scanning probe methods (tunnelling and force microscopies, STM and AFM) is a unique way to get an information about crystallographic and electronic structure of the studied surface. Here we apply these…

Scanning probe microscopy (SPM) images of regularly arranged spatially periodic objects can be processed crystallographically. The resulting information may be used to remove from the SPM image distortions that are due to a less than…

材料科学 · 物理学 2020-12-16 Peter Moeck

Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable…

材料科学 · 物理学 2015-06-24 F. J. Giessibl , H. Bielefeldt , S. Hembacher , J. Mannhart

Scanning tunneling microscopy using a CO-functionalized tip is combined with simulations to explore the impact of the CO tilt angle on topographies of a single Cu atom and CO molecule adsorbed on Cu(111). Images of the Cu atom acquired with…

材料科学 · 物理学 2024-09-24 Ivan Abilio , Nicolas Néel , Jörg Kröger , Krisztián Palotás

The Field Ion Microscope (FIM) can be used to characterize the atomic configuration of the apex of sharp tips. These tips are well suited for Scanning Probe Microscopy (SPM) since they predetermine SPM resolution and electronic structure…

介观与纳米尺度物理 · 物理学 2012-08-07 William Paul , Yoichi Miyahara , Peter Grütter

A scanning tunneling microscopy (STM) image of a hydrogen-adsorbed Si(001) surface is studied using first-principles electron-conduction calculation. The resultant STM image and scanning tunneling spectroscopy spectra are in agreement with…

材料科学 · 物理学 2009-11-11 Tomoya Ono , Shinya Horie , Katsuyoshi Endo , Kikuji Hirose

Scanning tunnelling microscopy (STM) with a functionalized tip apex reveals the geometric and electronic structure of a sample within the same experiment. However, the complex nature of the signal makes images difficult to interpret and has…

材料科学 · 物理学 2023-12-18 Lauri Kurki , Niko Oinonen , Adam S. Foster

Scanning Tunneling Microscopy (STM) is a powerful technique that utilizes quantum tunneling to visualize atomic surfaces with high precision. This study presents detailed topographic maps and evaluates the local density of states (LDOS) for…

介观与纳米尺度物理 · 物理学 2024-02-19 Dhananjay Saikumar

Scanning tunnelling microscopy (STM) is a powerful technique for imaging surfaces with atomic resolution, providing insight into physical and chemical processes at the level of single atoms and molecules. A regular task of STM image…

Ballistic conductance through a single atom adsorbed on a metallic surface and probed by a scanning tunneling microscope (STM) tip can be decomposed into eigenchannel contributions, which can be potentially obtained from shot noise…

介观与纳米尺度物理 · 物理学 2015-05-27 Martyna Polok , Dmitry V. Fedorov , Alexei Bagrets , Peter Zahn , Ingrid Mertig

Crystallographic image processing (CIP) techniques may be utilized in scanning probe microscopy (SPM) to glean information that has been obscured by signals from multiple probe tips. This may be of particular importance for scanning…

材料科学 · 物理学 2020-07-07 Jack C. Straton , Peter Moeck , Bill Moon , Taylor T. Bilyeu

With the invention of scanning probe techniques, direct imaging of single atoms and molecules became possible. Today, scanning tunnelling microscopy (STM) routinely provides angstrom-scale image resolution. At the same time, however, STM…

介观与纳米尺度物理 · 物理学 2024-01-30 C. Weiss , C. Wagner , C. Kleimann , F. S. Tautz , R. Temirov

Recently, the family of high-resolution scanning probe imaging techniques using decorated tips has been complimented by a method based on inelastic electron tunneling spectroscopy (IETS). The new technique resolves the inner structure of…

介观与纳米尺度物理 · 物理学 2014-12-03 Prokop Hapala , F. Stefan Tautz , Ruslan Temirov , Pavel Jelínek

Scanning tunneling microscopy (STM) has been a fundamental tool to characterize many-body effects in condensed matter systems, from extended solids to quantum dots. STM of molecules decoupled from the supporting conductive substrate has the…

介观与纳米尺度物理 · 物理学 2011-01-14 Dimitrios Toroz , Massimo Rontani , Stefano Corni

Scanning tunneling microscopes (STM) are used extensively for studying and manipulating matter at the atomic scale. In spite of the critical role of the STM tip, the control of the atomic-scale shape of STM tips remains a poorly solved…

介观与纳米尺度物理 · 物理学 2017-12-11 Sumit Tewari , Koen M. Bastiaans , Milan P. Allan , Jan M. van Ruitenbeek
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