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A powerful technique is introduced for simulating mechanical and electromechanical properties of one-dimensional nanostructures under arbitrary combinations of bending, twisting, and stretching. The technique is based on a novel control of…

介观与纳米尺度物理 · 物理学 2016-09-28 Pekka Koskinen

Scanning tunneling microscope (STM) has presented a revolutionary methodology to the nanoscience and nanotechnology. It enables imaging the topography of surfaces, mapping the distribution of electronic density of states, and manipulating…

介观与纳米尺度物理 · 物理学 2020-09-07 Wonhee Ko , Chuanxu Ma , Giang D. Nguyen , Marek Kolmer , An-Ping Li

Nanoparticle surface structural dynamics is believed to play a significant role in regulating functionalities such as diffusion, reactivity, and catalysis but the atomic-level processes are not well understood. Atomic resolution…

We present a machine learning based model that can predict the electronic structure of quasi-one-dimensional materials while they are subjected to deformation modes such as torsion and extension/compression. The technique described here…

材料科学 · 物理学 2022-06-01 Shashank Pathrudkar , Hsuan Ming Yu , Susanta Ghosh , Amartya S. Banerjee

The scanning electron microscope (SEM) recordings of dynamic nano-electromechanical systems (NEMS) are difficult to analyze due to the noise caused by low frame rate, insufficient resolution and blurriness induced by applied electric…

图像与视频处理 · 电气工程与系统科学 2023-07-19 Ege Erdem , Berke Demiralp , Hadi S Pisheh , Peyman Firoozy , Ahmet Hakan Karakurt , M. Selim Hanay

A common task in cryo-electron microscopy (cryo-EM) data processing is to compare three-dimensional density maps of macromolecules. In this paper, we propose an algorithm for aligning three-dimensional density maps that exploits common…

图像与视频处理 · 电气工程与系统科学 2023-02-27 Yael Harpaz , Yoel Shkolnisky

Arrays of aligned nanorods oriented perpendicular to a support, which are accessible by top-down lithography or by means of shape-defining hard templates, have received increasing interest as sensor components, components for nanophotonics…

A novel method for measuring the surface coverage of randomly distributed cylindrical nanoparticles such as nanorods and nanowires, using atomic force microscopy (AFM), is presented. The method offers several advantages over existing…

材料科学 · 物理学 2018-07-12 Francesca Bottacchi , Stefano Bottacchi , Thomas D. Anthopoulos

We propose a method of aligning a source image to a target image, where the transform is specified by a dense vector field. The two images are encoded as feature hierarchies by siamese convolutional nets. Then a hierarchy of aligner modules…

计算机视觉与模式识别 · 计算机科学 2019-04-05 Eric Mitchell , Stefan Keselj , Sergiy Popovych , Davit Buniatyan , H. Sebastian Seung

The scanning electron microscopy (SEM) is probably one the most fascinating examination approach that has been used since more than two decades to detailed inspection of micro scale objects. Most of the scanning electron microscopes could…

计算机视觉与模式识别 · 计算机科学 2016-02-18 Wichai Shanklin

Functional properties of nanomaterials strongly depend on their surface atomic structure, but they often become largely different from their bulk structure, exhibiting surface reconstructions and relaxations. However, most of the surface…

材料科学 · 物理学 2021-10-01 Juhyeok Lee , Chaehwa Jeong , Yongsoo Yang

Deterministic nanoassembly may enable unique integrated on-chip quantum photonic devices. Such integration requires a careful large-scale selection of nanoscale building blocks such as solid-state single-photon emitters by the means of…

The self-assembly of nanocrystals enables new classes of materials whose properties are controlled by the periodicities of the assembly, as well as by the size, shape and composition of the nanocrystals. While self-assembly of spherical…

Feature matching and finding correspondences between endoscopic images is a key step in many clinical applications such as patient follow-up and generation of panoramic image from clinical sequences for fast anomalies localization.…

计算机视觉与模式识别 · 计算机科学 2022-08-25 Manel Farhat , Houda Chaabouni-Chouayakh , Achraf Ben-Hamadou

The scanning electron microscope (SEM) produces an image of a sample by scanning it with a focused beam of electrons. The electrons interact with the atoms in the sample, which emit secondary electrons that contain information about the…

计算机视觉与模式识别 · 计算机科学 2017-09-08 Shahar Tsiper , Or Dicker , Idan Kaizerman , Zeev Zohar , Mordechai Segev , Yonina C. Eldar

Artificial Intelligence & Nanotechnology are promising areas for the future of humanity. While Deep Learning based Computer Vision has found applications in many fields from medicine to automotive, its application in nanotechnology can open…

计算机视觉与模式识别 · 计算机科学 2022-01-05 Rajagopal A , Nirmala V , Andrew J , Arun Muthuraj Vedamanickam.

The advancements in additive manufacturing (AM) technology have allowed for the production of geometrically complex parts with customizable designs. This versatility benefits large-scale space-frame structures, as the individual design of…

计算工程、金融与科学 · 计算机科学 2023-12-05 Oguz Oztoprak , Alexander Paolini , Pierluigi D'Acunto , Ernst Rank , Stefan Kollmannsberger

The 3D characterization of microstructures is crucial for understanding and designing functional materials. However, the scanning electron microscope (SEM), widely used in scientific research, captures only 2D electron intensity…

图像与视频处理 · 电气工程与系统科学 2026-04-06 Shuo Chen , Yijin Li , Xi Zheng , Guofeng Zhang

In the field of materials science, microscopy is the first and often only accessible method for structural characterization. There is a growing interest in the development of machine learning methods that can automate the analysis and…

材料科学 · 物理学 2022-09-28 Shizhao Lu , Brian Montz , Todd Emrick , Arthi Jayaraman