相关论文: Nanometer scale elemental analysis in the helium i…

Plasma profiling time of flight mass spectrometry (PP-TOFMS) has recently gained interest, as it enables the elemental profiling of semiconductor structures with high depth resolution in short acquisition times. As recently shown by Tempez…

We demonstrate the implementation of a simple time-of-flight (ToF) mass spectrometer with medium-mass resolution ($m/\Delta m\sim50$) geared towards the demands of atomic, molecular, and chemical physics experiments. By utilizing a novel…

Atomic force microscopy (AFM) is a well-known tool for studying surface roughness and to collect depth information about features on the top atomic layer of samples. By combining secondary ion mass spectroscopy (SIMS) with focused ion beam…

Recently, we reported an ion trap experiment with an integrated time-of-flight mass spectrometer (TOFMS) [Phys. Rev. Appl. 2, 034013 (2014)] focussing on the improvement of mass resolution and detection limit due to sample preparation at…

High-spatial-resolution secondary ion mass spectrometry offers a method for mapping lithium at nanoscale lateral resolution. Practical implementation of this technique offers significant potential for revealing the distribution of Li in…

This paper describes the use of the time-of-flight (TOF) technique as a particle identification method for the HERMES experiment. The time-of-flight is measured by two 1x4 m^2 scintillation hodoscopes that initially were designed for the…

Time-of-flight (ToF) measurements is a possible alternative to anti-scatter grids in computed tomography (CT). Simulations have shown a possible 75% reduction in the detrimental scattering contribution with a 100 ps FWHM timing resolution.…

We describe a spin-resolved electron spectrometer capable of uniquely efficient and high energy resolution measurements. Spin analysis is obtained through polarimetry based on low-energy exchange scattering from a ferromagnetic thin-film…

The quality of high-power impulse magnetron sputtering (HiPIMS) deposited films can often improve through the effective use of metal-ion acceleration, requiring precise measurements of time-of-flight (ToF). These measurements are commonly…

The Time-of-Flight (ToF) technique coupled with semiconductor-like detectors, as silicon carbide and diamond, is one of the most promising diagnostic methods for high-energy, high repetition rate, laser-accelerated ions allowing a full…

We report results of high-resolution TOF SIMS (time of flight secondary ion mass spectrometry) depth profiling experiments on a nanolayered structure, a stack of 16 alternating MgO and ZnO ~5.5 nm layers grown on a Si substrate by atomic…

The continuous technological development of electronic devices and the introduction of new materials leads to ever greater demands on the fabrication of semiconductor heterostructures and their characterization. This work focuses on…

The purpose of this study was to show how advanced concepts of compact, lossless and "Time Of Flight" (TOF) capable electronics similar to those foreseen for the LHC and ILC experiments could be fairly and easily transferred to the medical…

The small time gap of synchrotron radiation in conventional multi-bunch mode (100-500MHz) is prohibitive for time-of-flight (ToF) based electron spectroscopy. Even the new generation of delay-line detectors with improved time resolution…

Transition Edge Sensor (TES) bolometers are a well-established technology with a strong track record in experimental cosmology, making them ideal for current and future radio astronomy instruments. The Tomographic Ionized-carbon Mapping…

We study a simple modification to the conventional time of flight mass spectrometry (TOFMS) where a \emph{variable} and (pseudo)-\emph{random} pulsing rate is used which allows for traces from different pulses to overlap. This modification…

We report the design of an angular array of electron Time-of-Flight (eToF) spectrometers intended for non-invasive spectral, temporal, and polarization characterization of single shots of high-repetition rate, quasi-continuous,…

Efforts to push the spatiotemporal imaging-resolution limits of femtosecond (fs) laser-driven ultrafast electron microscopes (UEMs) to the combined angstrom-fs range will benefit from stable sources capable of generating high bunch charges.…

An analytical method is presented with allows to estimate the energy resolution of time-of-flight neutron spectrometers, as well as its partial contributions, over a dynamical range that extends from the elastic line to the accessible…

Time-Of-Flight (TOF) technique coupled with semiconductor detectors is a powerful instrument to provide real-time characterization of ions accelerated because of laser-matter interactions. Nevertheless, the presence of strong…