相关论文: Characterization of multilayer stack parameters fr…
The ability to form images through hair-thin optical fibres promises to open up new applications from biomedical imaging to industrial inspection. Unfortunately, deployment has been limited because small changes in mechanical deformation…
The imaging sharpness of an X-ray telescope is chiefly determined by the optical quality of its focusing optics, which in turn mostly depends on the shape accuracy and the surface finishing of the grazing-incidence X-ray mirrors that…
Due to the energy-dependent nature of the attenuation coefficient and the polychromaticity of the X-ray source, beam hardening effect occurs when X-ray photons penetrate through an object, causing a nonlinear projection data. When a linear…
The soft X-rays (SXRs: 90--150 $\r{A}$) are among the most interesting spectral ranges to be investigated in the next generation of solar missions due to their unique capability of diagnosing phenomena involving hot plasma with temperatures…
Pulse-profile modeling (PPM) of thermal X-ray emission from rotation-powered millisecond pulsars enables simultaneous constraints on the mass $M$, radius $R$, and hence the equation of state of cold, dense matter. However, Bayesian PPM has…
One of the most important parameters determining the sensitivity of X-ray telescopes is their effective area as a function of the X-ray energy. The computation of the effective area of a Wolter-I mirror, with either a single layer or…
This study presents a comprehensive methodology for determining the thermal conductivity (TC) of materials with high reliability. The methodology addresses issues such as surface topographical variations and substrate interference by…
All coronagraphic instruments for exoplanet high-contrast imaging need wavefront correction systems to reject optical aberrations and create sufficiently dark holes. Since the most efficient wavefront correction algorithms (controllers and…
The inverse problem of multilayer thin-film optical coatings design represents a complex combinatorial-continuous optimization challenge. We present PRISM (Position-encoded Regressive Inverse Spectral Model), a unified decoder-only…
Powder X-ray diffraction analysis is a critical component of materials characterization methodologies. Discerning characteristic Bragg intensity peaks and assigning them to known crystalline phases is the first qualitative step of…
Although the process variables of epoxy resins alter their mechanical properties, the visual identification of the characteristic features of X-ray images of samples of these materials is challenging. To facilitate the identification, we…
We developed an instrument design capable of measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics. A set of multilayer-coated flats reflects the dispersed X-rays to the instrument detectors. The…
The build up of polyelectrolyte multilayers (PEMs) was observed by a silicon-on-insulator (SOI) based thin film resistor. Differently charged polyelectrolytes adsorbing to the sensor surface result in defined potential shifts, which…
Thin film oxides are a source of endless fascination for the materials scientist. These materials are highly flexible, can be integrated into almost limitless combinations, and exhibit many useful functionalities for device applications.…
Achieving the desired optical response from a multilayer thin-film structure over a broad range of wavelengths and angles of incidence can be challenging. An advanced thin-film structure can consist of multiple materials with different…
Herein, the concept of point of darkness based on polarized light phase difference and absorption of light is demonstrated by simulations using low refractive index and extinction coefficient semiconductor and dielectric, and high…
Analysis of measured X-ray diffraction (XRD) data from heterostructures with fitting analysis is discussed, for which computer program was written. Lattice constant and Poisson's ratio of a multi-compound layer is calculated from Vegard's…
Plasma profiling time of flight mass spectrometry (PP-TOFMS) has recently gained interest, as it enables the elemental profiling of semiconductor structures with high depth resolution in short acquisition times. As recently shown by Tempez…
This review aims to introduce the x-ray emission spectroscopy (XES) and resonant inelastic x-ray scattering (RIXS) techniques to the materials scientist working with magnetic semiconductors (e.g. semiconductors doped with 3d transition…
This work illustrates and compares some methods to measure the most relevant parameters of silicon photo-multipliers (\sipm{}s), such as photon detection efficiency as a function of over-voltage and wavelength, dark count rate, optical…