相关论文: Accurate distance control between a probe and a su…

We present two experiments in closed-loop feedback control. In the first experiment, students control the pointing angle of a laser to "lock" the laser onto a "target." In the second, students stabilize the pathlength difference in two arms…

Atomic force microscopy using a magnetic tip is a promising tool for investigating conductivity on the nano-scale. By the oscillating magnetic tip eddy currents are induced in the conducting parts of the sample which can be detected in the…

High-frequency atomic force microscopy has enabled extraordinary new science through large bandwidth, high speed measurements of atomic and molecular structures. However, traditional optical detection schemes restrict the dimensions, and…

The size distribution of aerosol droplets is a key parameter in a myriad of processes, and it is typically measured with optical aids (e.g., lasers or cameras) that require sophisticated calibration, thus making the measurement cost…

Atomic force microscopy (AFM) has been constantly supporting nanosciences and nanotechnologies for over 30 years, being present in many fields from condensed matter physics to biology. It enables measuring very weak forces at the nanoscale,…

We investigate the capillary force that applies on a tilted cylinder as a function of its dipping angle i, using a home-built tilting Atomic Force Microscope (AFM) with custom made probes. A micrometric-size rod is glued at the end of an…

Measurements of the deflection induced by thermal noise have been performed on a rectangular atomic force microscope cantilever in air. The detection method, based on polarization interferometry, can achieve a resolution of 1E-14 m/rtHz in…

An ongoing challenge in atomic force microscope (AFM) experiments is the quantitative measurement of cantilever motion. The vast majority of AFMs use the optical beam deflection (OBD) method to infer the deflection of the cantilever. The…

Scanning Probe Microscopy allows for extreme resolution down to the atomic scale. Unfortunately, total scanning range is rather limited, therefore finding a specific position on the sample is tedious. This is an important limitation of many…

We experimentally surpass the 3dB limit to steady state parametric squeezing of a mechanical oscillator. The localization of a AFM cantilever, achieved by optimal estimation, is enhanced by up to 6.2 dB in one position quadrature when a…

In atomic force microscopy (AFM), the exchange and alignment of the AFM cantilever with respect to the optical beam and position-sensitive detector (PSD) are often performed manually. This process is tedious and time-consuming and sometimes…

Accurately handling contact with friction remains a core bottleneck for Material Point Method (MPM), from reliable contact point detection to enforcing frictional contact laws (non-penetration, Coulomb friction, and maximum dissipation…

Numerous cell types relate to their immediate environment by exerting a three-dimensional pressure field on their environment, with components both longitudinal and transverse to the cell membrane. This pressure field can in principle be…

We adjust the transient dynamics of a piezo-actuated bimorph Atomic Force Microscopy (AFM) probe using a state feedback controller. This approach enables us to adjust the quality factor and the resonance frequency of the probe…

We have performed the most realistic simulation to date of the operation of a scanning tunneling microscope. Probe-sample distances from beyond tunneling to actual surface contact are covered. We simultaneously calculate forces, atomic…

Micromanipulations, perfusions and measurements performed using glass microelectrodes filled with an electrolyte is a conventional technique for experimental morphological and membrane electrophysiological studies at a single cell and…

In error-tolerant applications, approximate adders have been exploited extensively to achieve energy efficient system designs. Mean error distance is one of the important error metrics used as a performance measure of approximate adders. In…

A Scanning Tunneling Microscope (STM) is one of the most important scanning probe tools available to study and manipulate matter at the nanoscale. In a STM, a tip is scanned on top of a surface with a separation of a few \AA. Often, the…

A stripline-type near-field microwave probe is microfabricated for microwave impedance microscopy. Unlike the poorly shielded coplanar probe that senses the sample tens of microns away, the stripline structure removes the stray fields from…

Knowledge of surface forces is the key to understanding a large number of processes in fields ranging from physics to material science and biology. The most common method to study surfaces is dynamic atomic force microscopy (AFM). Dynamic…