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We present a robust but still efficient simulation approach for high-resolution scanning tunneling microscopy with a flexible tip apex showing sharp submolecular features. The approach takes into account the electronic structure of sample…

介观与纳米尺度物理 · 物理学 2017-01-11 O. Krejci , P. Hapala , M. Ondracek , P. Jelinek

Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable…

材料科学 · 物理学 2015-06-24 F. J. Giessibl , H. Bielefeldt , S. Hembacher , J. Mannhart

We describe a first principles method to calculate scanning tunneling microscopy (STM) images, and compare the results to well-characterized experiments combining STM with atomic force microscopy (AFM). The theory is based on density…

介观与纳米尺度物理 · 物理学 2018-09-14 Alexander Gustafsson , Norio Okabayashi , Angelo Peronio , Franz J. Giessibl , Magnus Paulsson

Intermolecular features in atomic force microscopy (AFM) images of organic molecules have been ascribed to intermolecular bonds. A recent theoretical study [P. Hapala et al., Phys. Rev. B 90, 085421 (2014)] showed that these features can…

We propose a new method to investigate interactions involved in atomic force microscopy (AFM). It is a dynamical method relying on the growth of oscillations via parametric resonance. With this method the second and third derivatives of the…

材料科学 · 物理学 2007-05-23 Franz-Josef Elmer

Here we show scanning tunnelling microscopy (STM), non-contact atomic force microscopy (AFM) and inelastic electron tunnelling spectroscopy (IETS) measurements on organic molecule with a CO- terminated tip at 5K. The high-resolution…

With the invention of scanning probe techniques, direct imaging of single atoms and molecules became possible. Today, scanning tunnelling microscopy (STM) routinely provides angstrom-scale image resolution. At the same time, however, STM…

介观与纳米尺度物理 · 物理学 2024-01-30 C. Weiss , C. Wagner , C. Kleimann , F. S. Tautz , R. Temirov

Recently, the family of high-resolution scanning probe imaging techniques using decorated tips has been complimented by a method based on inelastic electron tunneling spectroscopy (IETS). The new technique resolves the inner structure of…

介观与纳米尺度物理 · 物理学 2014-12-03 Prokop Hapala , F. Stefan Tautz , Ruslan Temirov , Pavel Jelínek

Atomic resolution imaging is demonstrated using a hybrid scanning tunneling/near-field microwave microscope (microwave-STM). The microwave channels of the microscope correspond to the resonant frequency and quality factor of a coaxial…

介观与纳米尺度物理 · 物理学 2011-08-16 Jonghee Lee , Christian J. Long , Haitao Yang , Xiao-Dong Xiang , Ichiro Takeuchi

Structured metallic tips are increasingly important for optical spectroscopies such as tip-enhanced Raman spectroscopy (TERS), with plasmonic resonances frequently cited as a mechanism for electric field enhancement. We probe the local…

Atomic force microscopy (AFM) with molecule-functionalized tips has emerged as the primary experimental technique for probing the atomic structure of organic molecules on surfaces. Most experiments have been limited to nearly planar…

An atomic force microscope~(AFM) tip, with a few nm-thick noble metal coating, gives rise to strong electric-field at the near-field of tip apex, i.e. hot spot, when illuminated with a beam of light linearly polarized in the axial…

介观与纳米尺度物理 · 物理学 2019-12-10 Ramazan Sahin , Mehmet Gunay , Alpan Bek , Mehmet Emre Tasgin

Atomic Force Microscopy (AFM) operating in the frequency modulation mode with a metal tip functionalized with a CO molecule images the internal structure of molecules with an unprecedented resolution. The interpretation of these images is…

材料科学 · 物理学 2022-12-29 Jaime Carracedo-Cosme , Rubén Pérez

Sub-nm resolution images can be achieved by Atomic Force Microscopy (AFM) on samples that are deposited on hard substrates. However, it is still extremely challenging to image soft interfaces, such as biological membranes, due to the…

We investigate the modification of photoluminescence (PL) from single semiconductor nanocrystal quantum dots (NCs) in proximity of metal and semiconducting Atomic Force Microscope (AFM) tips. The presence of the tip alters the radiative…

化学物理 · 物理学 2016-09-28 Yuval Ebenstein , Eyal Yoskovitz , Ronny Costi , Asaf Aharoni , Uri Banin

Bond-resolved STM (BRSTM) is a recent technique that combines the advantages of scanning tunneling microscopy (STM) with the outstanding intramolecular resolution provided by non-contact atomic force microscopy (ncAFM) using a…

Tip functionalization in AFM allows imaging organic nano-structures with sub-molecular resolution. Here, recent progress by using atomically defined copper-oxide tips is discussed. With their outstanding rigidity and elemental selectivity…

材料科学 · 物理学 2025-10-22 Harry Mönig

With recent advances in dynamic scanning probe microscopy techniques, it is now a routine to image the sub-molecular structure of molecules with atomically-engineered tips which are prepared via controlled modification of the tip…

应用物理 · 物理学 2019-03-06 Omur E. Dagdeviren

Intermodulation atomic force microscopy (ImAFM) is a mode of dynamic atomic force microscopy that probes the nonlinear tip-surface force by measurement of the mixing of multiple tones in a frequency comb. A high $Q$ cantilever resonance and…

介观与纳米尺度物理 · 物理学 2013-02-06 Daniel Platz , Daniel Forchheimer , Erik A. Tholén , David B. Haviland

Atomic force microscopy (AFM) is a key tool for characterising nanoscale structures, with functionalised tips now offering detailed images of the atomic structure. In parallel, AFM simulations using the particle probe model provide a…

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