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相关论文: Application of photoreflectance to advanced multil…

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Reflective ptychography is a promising lensless imaging technique with a wide field of view, offering significant potential for applications in semiconductor manufacturing and detection. However, many semiconductor materials are coated with…

光学 · 物理学 2025-01-03 Yun Gao , Qijun You , Peixiang Lu , Wei Cao

In this work we present results of the analysis of thermal properties of high-power laser bars obtained by spatially resolved thermoreflectance (TR) spectroscopy. Thermoreflectance is a modulation technique relying on periodic facet…

材料科学 · 物理学 2015-05-13 D. Pierscinska , K. Pierscinski , M. Bugajski , J. W. Tomm

Phase recovery (PR) refers to calculating the phase of the light field from its intensity measurements. As exemplified from quantitative phase imaging and coherent diffraction imaging to adaptive optics, PR is essential for reconstructing…

Time-domain thermoreflectance (TDTR) is a well-established pump/probe method for measuring thermal conductivity and interface conductance of multilayers. Interpreting signals in a TDTR experiment requires a thermal model.In standard…

应用物理 · 物理学 2022-04-20 Wanyue Peng , Richard Wilson

Photoreflectance is used for the characterisation of semiconductor samples, usually by sweeping the monochromatized probe beam within the energy range comprised between the highest value set by the pump beam and the lowest absorption…

材料科学 · 物理学 2017-01-16 D. Fuertes Marrón

We present multispectral rendering techniques for visualizing layered materials found in biological specimens. We are the first to use acquired data from the near-infrared and ultraviolet spectra for non-photorealistic rendering (NPR).…

图形学 · 计算机科学 2021-09-03 Corey Toler-Franklin , Shashank Ranjan

Thermoreflectance techniques, including time-domain thermoreflectance (TDTR), frequency-domain thermoreflectance (FDTR), and the square-pulsed source (SPS) method, are powerful tools for characterizing the thermal properties of bulk and…

应用物理 · 物理学 2025-04-04 Tao Chen , Puqing Jiang

Spatial mapping of thermal properties is critical for unveiling the structure-property relation of materials, heterogeneous interfaces, and devices. These property images can also serve as datasets for training artificial intelligence…

应用物理 · 物理学 2025-07-18 Haobo Yang , Zhenguo Zhu , Zhongnan Xie , Jinhong Du , Shuo Bai , Hong Guo , Te-Huan Liu , Ronggui Yang , Xin Qian

The Kerr parametric oscillator (KPO) has recently attracted considerable attention from the perspective of its applications to quantum information processing, and understanding its properties is an important challenge. Spectroscopic…

The establishment of a rigorous theory on thermodynamics of light management in photovoltaics that accommodates various loss mechanisms as well as wave-optical effects in the absorption and reemission of light is at stake in this…

This paper presents the development of instrumentation for the measurement of high-temperature thermal conductivity of bulk and coatings using a modulated photothermal radiometry (MPR) method, where a sample is heated by an…

材料科学 · 物理学 2020-11-23 Jian Zeng , Ka Man Chung , Qingyang Wang , Xiaoxin Wang , Yu Pei , Peiwen Li , Renkun Chen

Photoluminescence (PL) is a ubiquitous proxy for material quality in optoelectronic devices, widely used for high-throughput materials discovery. However, we demonstrate that in the presence of charge-selective contacts, PL loses its…

The physical principles motivating the Z-scanning laser photoreflectance technique are discussed. The technique is shown to provide a powerful non-contact means to unambiguously characterize electronic transport properties in…

介观与纳米尺度物理 · 物理学 2021-12-08 Will Chism

Anti-reflective coatings (ARCs) are used on the vast majority of solar photovoltaic (PV) modules to increase power production. However, ARC longevity can vary from less than 1 year to over 15 years depending on coating quality and…

仪器与探测器 · 物理学 2021-03-03 Todd Karin , David Miller , Anubhav Jain

Reflectometry is a technique that uses the light reflected by a sample to determine properties of the sample. Interferometric reflectometry uses interference between two beams, one of which is incident on ---and reflected back by--- a…

光学 · 物理学 2019-10-10 Alexander Nahmad-Rohen , Wolfgang Langbein

In the previous studies, the ultraviolet light thermoreflectance (UV-TDTR) signal from bulk semiconducting samples cannot be well explained by a thermal models based on the assumption that the heat is both absorbed and probed near the…

应用物理 · 物理学 2023-11-21 Dian Li , Joseph Feser

Measuring thermal properties of materials is not only of fundamental importance in understanding the transport processes of energy carriers (electrons and phonons) but also of practical interest in developing novel materials with desired…

材料科学 · 物理学 2018-11-14 Puqing Jiang , Xin Qian , Ronggui Yang

Photoplasticity, the light-induced change in plastic deformation, plays a pivotal role in the mechanical durability and manufacturing of semiconductor materials. Yet, its governing mechanisms remain incompletely understood, owing to the…

材料科学 · 物理学 2026-03-31 Huicong Chen , Mingqiang Li , Zheyuan Ji , Yu Zou

Optical spectroscopy techniques such as differential reflectance and transmittance have proven to be very powerful techniques to study 2D materials. However, a thorough description of the experimental setups needed to carry out these…

Surface Plasmon Resonance (SPR) offers a powerful tool for label-free and non-invasive characterization of biomolecular interactions. To date, several experimental configurations, based on two fundamental physical phenomena, e.g.,…

光学 · 物理学 2022-11-15 Nishant Shukla , Pawan Chetri , Ratan Boruah , Ankur Gogoi , Gazi A Ahmed
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