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The use of coherent x-ray beams has been greatly developing for the past decades. They are now used by a wide scientific community to study biological materials, phase transitions in crystalline materials, soft matter, magnetism, strained…

材料科学 · 物理学 2010-09-01 V. L. R. Jacques , S. Ravy , D. Le Bolloc'h , E. Pinsolle , M. Sauvage-Simkin , F. Livet

The interaction of high-energy electrons and X-ray photons with soft semiconductors such as halide perovskites is essential for the characterisation and understanding of these optoelectronic materials. Using nano-probe diffraction…

X-ray reflectometry (XRR) provides researchers and manufacturers with a non-destructive way to determine thickness, roughness, and density of thin films deposited on smooth substrates. Due to the nested nature of equations modeling this…

材料科学 · 物理学 2015-06-12 Donald Windover , David L. Gil , Yasushi Azuma , Toshiyuki Fujimoto

Nanoporous thin-films are an important class of materials, offering a way to observe fundamental surface and bulk processes with particles larger than individual atoms, but small enough to interact significantly with each other through…

材料科学 · 物理学 2016-03-22 Jeffrey G. Ulbrandt , Yang Li , Randall L. Headrick

To take advantage of high-resolution optics sensitive to a broad energy range, future X-ray imaging instruments will require thick detectors with small pixels. This pixel aspect ratio affects spectral response in the soft X-ray band, vital…

Resonant (elastic) soft x-ray scattering (RSXS) offers a unique element, site, and valence specific probe to study spatial modulations of charge, spin, and orbital degrees of freedom in solids on the nanoscopic length scale. It cannot only…

材料科学 · 物理学 2013-04-12 J. Fink , E. Schierle , E. Weschke , J. Geck

The properties of artificially grown thin films are often strongly affected by the dynamic relationship between surface growth processes and subsurface structure. Coherent mixing of X-ray signals promises to provide an approach to better…

The microstructure, electronic structure, and chemical bonding of chromium carbide thin films with different carbon contents have been investigated with high-resolution transmission electron microscopy, electron energy loss spectroscopy and…

介观与纳米尺度物理 · 物理学 2012-05-04 Martin Magnuson , Matilda Andersson , Jun Lu , Lars Hultman , Ulf Jansson

Emergent behavior at complex oxide interfaces has driven much of the research in the oxide thin film community for the past twenty years. Interfaces have been engineered for potential applications in spintronics, topological quantum…

Many nano and quantum devices, with their sizes often spanning from millimeters down to sub-nanometer, have intricate low-dimensional, non-uniform, or hierarchical structures on surfaces and interfaces. Since their functionalities are…

The discovery of superconductivity in the bulk nickelates under high pressure is a major advance in physics. The recent observation of superconductivity at ambient pressure in compressively strained bilayer nickelate thin films has now…

We demonstrate high-resolution non-iterative holographic coherent diffraction imaging with hard X-rays using a novel phase-shifting reference, fabricated by atomic layer deposition to produce nanosharp 3D structure. The method surpasses the…

介观与纳米尺度物理 · 物理学 2016-10-17 Mirna Saliba , Jeroen Bosgra , Christoph Rau , Christian David , Aaron D. Parsons , Ulrich H. Wagner , Pierre Thibault

Angle-resolved photoemission spectroscopy (ARPES) is a powerful probe of electron correlations in two-dimensional layered materials. In this Letter we demonstrate that ARPES can be used to probe the onset of exciton condensation in…

强关联电子 · 物理学 2013-02-25 Stefan Rist , A. A. Varlamov , A. H. MacDonald , Rosario Fazio , Marco Polini

Auger parameter analysis provides in-depth information about the electronic and chemical bonding properties of TiN and AlN thin films, which are relevant across a wide range of technologies. Meaningful interpretation and analysis of the…

材料科学 · 物理学 2025-06-17 O. V. Pshyk , J. Patidar , C. Cancellieri , S. Siol

Progress in performing angle-resolved photoemission spectroscopy (ARPES) with high spatial resolution in the order of 1~$\mu$m or less (nanoARPES) has opened the possibility to map the spectral function of solids on this tiny scale and…

强关联电子 · 物理学 2021-05-24 Philip Hofmann

Angle-resolved photoemission spectroscopy (ARPES) is one of the most direct methods of studying the electronic structure of solids. By measuring the kinetic energy and angular distribution of the electrons photoemitted from a sample…

强关联电子 · 物理学 2009-11-10 Andrea Damascelli

Poly (3-hexylthiophene) (P3HT) was thermally evaporated and deposited in vacuum. Infrared spectroscopy was used to confirm that the thin films were indeed P3HT, and showed that in-situ thermal evaporation provides a viable route for…

材料科学 · 物理学 2011-06-22 Haoyan Wei , L. Scudiero , Hergen Eilers

Interdiffusion phenomena between adjacent materials are highly prevalent in semiconductor device architectures and can present a major reliability challenge for the industry. To fully capture and better understand these phenomena,…

Thin film oxides are a source of endless fascination for the materials scientist. These materials are highly flexible, can be integrated into almost limitless combinations, and exhibit many useful functionalities for device applications.…

材料科学 · 物理学 2025-06-17 Steven R. Spurgeon

Understanding the mechanisms underlying a stable polarization at the surface of ferroelectric thin films is of particular importance both from a fundamental point of view and to achieve control of the surface polarization itself. In this…