相关论文: High resolution SIMS depth profiling of nanolayers
Magnetic resonance imaging (MRI) provides high spatial resolution and excellent soft-tissue contrast without using harmful ionising radiation. Dynamic MRI is an essential tool for interventions to visualise movements or changes of the…
Dual-frequency comb spectroscopy has emerged as a disruptive technique for measuring wide-spanning spectra with high resolution, yielding a particularly powerful technique for sensitive multi-component gas analysis. We present a…
The ambitious performance targets of modern wireless networks, including 6G and Industrial IoT (IIoT) systems, necessitate advanced hardware platforms utilizing millimeter-wave (mmWave) technology. High-frequency signals provide the…
We demonstrate spatial modification of the optical properties of thin-film metal oxides, zinc oxide and vanadium dioxide as representatives, using a commercial focused ion beam (FIB) system. Using a Ga+ FIB and thermal annealing, we…
Potentials that could accurately describe the irradiation damage processes are highly desired to figure out the atomic-level response of various newly-discovered materials under irradiation environments. In this work, we introduce a…
We present a novel approach to joint depth and normal estimation for time-of-flight (ToF) sensors. Our model learns to predict the high-quality depth and normal maps jointly from ToF raw sensor data. To achieve this, we meticulously…
The focused helium ion beam microscope is a versatile imaging and nanofabrication instrument enabling direct-write lithography with sub-10-nm resolution. Subsurface damage and swelling of substrates due to helium ion implantation is…
The inclusion of material identification in wireless communication system is an emerging area that offers many opportunities for 6G systems. By using reflected radio wave to determine the material of reflecting surface, not only the…
Previously reported nanodosimetric measurements of therapeutic-energy carbon ions penetrating simulated tissue have produced results that are incompatible with the predicted mean energy of the carbon ions in the nanodosimeter and previous…
Non-destructive nano-imaging of the internal structure of solid matter is only feasible using hard X-rays due to their high penetration. The highest resolution images are achieved at synchrotron radiation sources (SRF), offering superior…
We study the secrecy rate maximization problem in a millimeter wave (mmWave) network, consisting of a base station (BS), multiple intelligent reflecting surfaces (IRSs) (or reconfigurable intelligent surfaces (RISs)), multiple users, and a…
We report X-ray fluorescence (XRF) imaging of nanoscale inclusions of impurities for quantum technology. A very bright diffraction-limited focus of the X-ray beam produces very high sensitivity and resolution. We investigated gallium (Ga)…
Millimetre-wave observations represent an important tool for Cosmology studies. The Line Intensity Mapping (LIM) technique has been proposed to map in three dimensions the specific intensity due to line (e.g. [CII], CO) emission, for…
The nanoscale optical properties of high-quality MoS$_2$ nanoribbons are investigated using THz nanoscopy based on a scattering-type scanning probe. The nanoribbons comprise a multi-layer core, surrounded by monolayer edges. A featureless…
The combination of range sensors with color cameras can be very useful for robot navigation, semantic perception, manipulation, and telepresence. Several methods of combining range- and color-data have been investigated and successfully…
Focused ion beam (FIB) has been used as an effective tool for precise nanoscale fabrication. It has recently been employed to tailor defect engineering in functional nanomaterials such as two-dimensional transition metal dichalcogenides…
Nanostructures have become an attractive subject due to many applications, particularly the photonic bandgap effect observed in photonic crystals. Nevertheless, the fabrication of such structures remains a challenge because of accurate…
We present an assessment of a multi-method approach based on ion beam analysis to obtain high-resolution depth profiles of the total chemical composition of complex alloy systems. As a model system we employ an alloy based on several…
Thin membranes are highly sought-after for nanopore-based single-molecule sensing and fabrication of such membranes becomes challenging in the \lesssim10 nm thickness regime where a plethora of useful molecule information can be acquired by…
We present a non-destructive, spatially resolved thickness characterization method for rhombohedral (3R) molybdenum disulfide (MoS$_2$) on polydimethylsiloxane (PDMS) substrates. Unlike broadband spectroscopic approaches, the proposed…