相关论文: Calibration of piezoelectric positioning actuators…
We have performed an experimental characterization of the dynamics of oscillating quartz tuning forks which are being increasingly used in scanning probe microscopy as force sensors. We show that tuning forks can be described as a system of…
Piezoelectric quartz tuning forks have been employed as the force sensor in a dynamic mode scanning force microscope operating at temperatures down to 1.7 K at He-gas pressures of typically 5 mbar. An electrochemically etched tungsten tip…
Piezoelectric quartz tuning forks are investigated in view of their use as force sensors in dynamic mode scanning probe microscopy at temperatures down to 1.5 K and in magnetic fields up to 8 T. The mechanical properties of the forks are…
Determining sensor parameters is a prerequisite for quantitative force measurement. Here we report a direct, high-precision calibration method for quartz tuning fork(TF) sensors that are popular in the feld of nanomechanical measurement. In…
Atomic force microscopy (AFM) is an analytical surface characterization tool which can reveal a sample's topography with high spatial resolution while simultaneously probing tip-sample interactions. Local measurement of chemical properties…
A new approach, called Adaptive Q-control, for tapping-mode Atomic Force Microscopy (AFM) is introduced and implemented on a home-made AFM set-up utilizing a Laser Doppler Vibrometer (LDV) and a piezo-actuated bimorph probe. In the standard…
Atomic force microscopy (AFM) enables nanoscale characterization and has been widely applied to a broad range of systems. Over the past two decades, advances in high-speed AFM have enabled not only the imaging of static structures but also…
Quartz tuning forks are high-quality mechanical oscillators widely used in low temperature physics as viscometers, thermometers and pressure sensors. We demonstrate that a fork placed in liquid helium near the surface of solid helium is…
Dynamic phase microscopy has been applied for measurements of nanometer-scale displacements of a piezoelectric scanner. This scanner, which was designed for calibration purposes for scanning probe microscopy and TEM, exhibited a linear and…
We propose an elegant method for continuous electrical-tuning of plasmo-mechanical displacement and squeezing without changing plasmonic gap size. Recent experiments bend the mechanical oscillator (cantilever) in units of nm via…
The implementation of a tuning fork sensor in a scanning force microscope operational at 300 mK is described and the harmonic oscillator model of the sensor is motivated. These sensors exhibit very high quality factors at low temperatures.…
Calibration sources are an indispensable tool for all detectors. In acoustic particle detection the goal of a calibration source is to mimic neutrino signatures as expected from hadronic cascades. A simple and promising method for the…
Micro-scanners have been widely used in many optical applications. The micro-scanner presented in this paper uses multimorph-type bending actuators to tilt a square plate mirror. This paper presents a complete analytical model of the…
We investigate a microwave cavity-based displacement readout employing a split-post geometry for measuring the motion of a dielectric membrane. The cavity response to membrane displacement is predominantly quadratic when the membrane is…
We explain and demonstrate a new method of force- and position-calibration for optical tweezers with back-focal-plane photo detection. The method combines power spectral measurements of thermal motion and the response to a sinusoidal motion…
Modern particle accelerators and high-energy physics experiments that deployed up to several hundred of accelerating superconducting RF cavities require accurate frequency control. This is achieved by using cavity tuners typically actuated…
Piezoelectric actuators are critical for achieving high accelerating gradients and preventing RF trips in narrow-bandwidth superconducting radio-frequency (SRF) cavities by compensating for detuning caused by Lorentz force detuning.…
A method of distributed calibration of a probe microscope scanner is suggested which main idea consists in a search for a net of local calibration coefficients (LCCs) in the process of automatic measurement of a standard surface, whereby…
Piezoresponse force microscopy (PFM) is a powerful tool widely used to characterize piezoelectricity and ferroelectricity at the nanoscale. However, it is necessary to distinguish microscopic mechanisms between piezoelectricity and…
Higher harmonic modes in nanoscale silicon cantilevers and microscale quartz tuning forks are detected and characterized using a custom scanning optical homodyne interferometer. Capable of both mass and force sensing, these resonators…