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相关论文: Scanning probe microscopy imaging of metallic nano…

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We study the structure and the electronic properties of Au nanocontacts created by controlled electromigration of thin film devices, a method frequently used to contact molecules. In contrast to electromigration testing, a current is…

介观与纳米尺度物理 · 物理学 2021-11-04 Daniel Arnold , Michael Marz , Sebastian Schneider , Regina Hoffmann-Vogel

We demonstrate a scanning force microscope, based upon a quartz tuning fork, that operates below 100 mK and in magnetic fields up to 6 T. The microscope has a conducting tip for electrical probing of nanostructures of interest, and it…

介观与纳米尺度物理 · 物理学 2007-05-23 K. R. Brown , L. Sun , B. E. Kane

Scanning Probe Microscopy is used to study and quantify the nanoscale electric phenomena in the two classes of oxide systems, namely transport at electroactive grain boundaries and surface behavior of ferroelectric materials. Scanning…

材料科学 · 物理学 2007-05-23 Sergei V. Kalinin

During the dielectric breakdown process of thin solid-state nanopores, the application of high voltages may cause the formation of multi-nanopores on one chip, which number and sizes are important for their applications. Here, simulations…

化学物理 · 物理学 2024-10-30 Yinghua Qiu , Long Ma , Zhe Liu , Hongwen Zhang , Bowen Ai , Xinman Tu

In this study, we present a novel platform based on scanning microwave microscopy for manipulating and detecting tiny vibrations of nanoelectromechanical resonators using a single metallic tip. The tip is placed on the top of a grounded…

We use a cooled Scanning Probe Microscope (SPM) to electron motion in nanoscale devices. The charged tip of the SPM is raster scanned at a constant height above the surface as the conductance of the device is measured. The image charge…

介观与纳米尺度物理 · 物理学 2017-03-08 Sagar Bhandari , Gil-Ho Lee , Philip Kim , Robert M. Westervelt

We demonstrate the combination of scanning force microscopy and scanning tunneling spectroscopy in a local probe microscope operating at very low temperature (60 mK). This local probe uses a quartz tuning fork ensuring high tunnel junction…

超导电性 · 物理学 2016-08-16 Julien Senzier , Pengshun S. Luo , Hervé Courtois

We study the optical and electrical properties of silver films with a graded thickness obtained through metallic evaporation in vacuum on a tilted substrate to evaluate their use as semitransparent electrical contacts. We measure their…

Scanning tunnelling microscopy and break-junction experiments realize metallic and molecular nanocontacts that act as ideal one-dimensional channels between macroscopic electrodes. Emergent nanoscale phenomena typical of these systems…

介观与纳米尺度物理 · 物理学 2016-06-22 Ryan Requist , Pier Paolo Baruselli , Alexander Smogunov , Michele Fabrizio , Silvio Modesti , Erio Tosatti

We show that scanning gate microscopy can be used for probing electron-electron interactions inside a nanostructure. We assume a simple model made of two non-interacting strips attached to an interacting nanosystem. In one of the strips,…

介观与纳米尺度物理 · 物理学 2008-10-07 Axel Freyn , Ioannis Kleftogiannis , Jean-Louis Pichard

Scanning probe microscopy is one of the most versatile windows into the nanoworld, providing imaging access to a variety of sample properties, depending on the probe employed. Tunneling probes map electronic properties of samples, magnetic…

介观与纳米尺度物理 · 物理学 2015-01-09 Thomas Häberle , Dominik Schmid-Lorch , Friedemann Reinhard , Jörg Wrachtrup

The most direct definition of a patterning process' resolution is the smallest half-pitch feature it is capable of transferring onto the substrate. Here we demonstrate that thermal Scanning Probe Lithography (t-SPL) is capable of…

Using a recent continuum model of a single-crystal nanowire morphological evolution in the applied axial electric field, an axisymmetric evolution of a microscopically rough nanowire surface is computed. Morphological evolution results in a…

材料科学 · 物理学 2023-11-21 Mikhail Khenner

We have developed a fast, yet highly reproducible method to fabricate metallic electrodes with nanometer separation using electromigration (EM). We employ four-terminal instead of two-terminal devices in combination with an analog feedback…

介观与纳米尺度物理 · 物理学 2009-11-13 Zheng-Ming Wu , Michael Steinacher , Roman Huber , Michel Calame , Sense Jan van der Molen , Christian Schonenberger

We investigate the histograms of conductance values obtained during controlled electromigration thinning of Cu thin films. We focus on the question whether the most frequently observed conductance values, apparent as peaks in conductance…

介观与纳米尺度物理 · 物理学 2017-09-22 Robert Pfender-Siedle , Julia Hauser , Regina Hoffmann-Vogel

Research in semiconductor physics has advanced to the study of two-dimensional (2D) materials where the surface controls electronic transport. A scanning probe microscope (SPM) is an ideal tool to image electronic motion in these devices by…

介观与纳米尺度物理 · 物理学 2017-02-01 Sagar Bhandari , Robert M. Westervelt

Understanding light-matter interaction at the nanoscale by observation of fine details of electromagnetic fields is achieved by bringing nanoscale probes into the nearfield of light sources, capturing information that is lost in the far…

光学 · 物理学 2021-09-24 Farbod Shafiei , Michael C. Downer

Granular aluminium is a high kinetic inductance thin film superconductor which, when formed into nanowires can undergo an intrinsic electromigration process. We use a combination of experimental and computational approaches to investigate…

Using thermal emission microscopy, we investigate heating in Pt nanowires before and during electromigration. The wires are observed to reach temperatures in excess of 1000 K. This is beyond the thermal decomposition threshold for many…

材料科学 · 物理学 2009-05-21 Daniel R. Ward , Naomi J. Halas , Douglas Natelson

We use electrostatic force microscopy and scanned gate microscopy to probe the conducting properties of carbon nanotubes at room temperature. Multi-walled carbon nanotubes are shown to be diffusive conductors, while metallic single-walled…

介观与纳米尺度物理 · 物理学 2009-10-31 A. Bachtold , M. S. Fuhrer , S. Plyasunov , M. Forero , Erik H. Anderson , A. Zettl , Paul L. McEuen
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