相关论文: Quantitative methods for deconvolution of true top…
Dewetting of thin liquid films is monitored in situ by atomic force microscopy, results are compared with simulations. The experimental setting is mimicked as close as possible using the experimental parameters including the effective…
The coherence of quantum dot qubits fabricated in semiconductors is often limited by charge noise from defects in gate dielectrics, which are material- and process-dependent. Characterizing these defects is an important step towards…
Learning 3D parametric shape models of objects has gained popularity in vision and graphics and has showed broad utility in 3D reconstruction, generation, understanding, and simulation. While powerful models exist for humans and animals,…
The purpose of this work is the development and determination of higher-order continuum-like kinematic measures which characterize discrete kinematic data obtained from experimental measurement (e.g., digital image correlation) or kinematic…
The force between two interacting particles as a function of distance is one of the most fundamental curves in science. In this regard, Atomic Force Microscopy (AFM) represents the most powerful tool in nanoscience but with severe limits…
Standard statistical mechanics of conservative systems relies on the symplectic geometry of the phase space. This is exploited to derive Hamilton's equations, Liouville's theorem and to find the canonical invariant measure. In this work we…
The topology method is an algorithm for accurate estimation of instantaneous heartbeat intervals using millimeter-wave radar signals. In this model, feature points are extracted from the skin displacement waveforms generated by heartbeats…
This article presents a new force model for performing quantitative simulations of dense granular materials. Interactions between multiple contacts (MC) on the same grain are explicitly taken into account. Our readily applicable method…
The goal of this note is to describe a class of formal deformations of a symplectic manifold $M$ in the case when the base ring of the deformation problem involves parameters of non-positive degrees. The interesting feature of such…
The surface stress and the contact potential differences of elastically deformed faces of Al, Cu, Au, Ni, and Ti crystals are calculated within the modified stabilized jellium model using the self-consistent Kohn-Sham method. The obtained…
An original MEMS-based force sensing device is designed which allows to measure spatially resolved normal and tangential stress fields at the base of an elastomeric film. This device is used for the study of the contact stress between a…
It was shown recently that the Force Feedback Microscope can avoid the jump-to-contact in Atomic force Microscopy even when the cantilevers used are very soft, thus increasing force resolution. In this letter, we explore theoretical aspects…
We introduce a new geometric framework for relativistic particle dynamics based on contact geometry and suitable for treating dissipative processes like particle decay. The dynamics is formulated on a nine--dimensional extended phase space…
Coherent x-ray micro-diffraction and local mechanical loading can be combined to investigate the mechanical deformation in crystalline nanostructures. Here we present measurements of plastic deformation in a copper crystal of sub-micron…
Tapping mode atomic force microscopy (AFM), also known as amplitude modulated (AM) or AC mode, is a proven, reliable and gentle imaging mode with widespread applications. Over the several decades that tapping mode has been in use,…
A general description of elastic matter and the long-range elastic interaction is propose. The type of the far-field interaction is determined by the way of breaking in the continuum distribution of the elastic field produced by topological…
This paper focuses on improved edge model based on Curvelet coefficients analysis. Curvelet transform is a powerful tool for multiresolution representation of object with anisotropic edge. Curvelet coefficients contributions have been…
In this paper we present a novel approach for representing and evolving deformable active contours. The method combines piecewise regular B{\'e}zier models and curve evolution defined by local Free Form Deformation. The contour deformation…
This paper presents a new method to obtain the deformation distribution on the main reflector of an antenna only by measuring the electric intensity on a spherical surface with the focal point as the center of the sphere, regardless of…
The analysis of the electronic surface properties of transition metal oxides being key materials for future nanoelectronics requires a direct characterization of the conductivity with highest spatial resolution. Using local conductivity…