相关论文: Quantitative methods for deconvolution of true top…

Atomic force microscopy is based on tip sample interaction, which is determined by the properties of tip and sample. Unfortunately, in particular in ambient conditions the tip as well as the sample are contaminated, and it is not clear how…

The existing object classification techniques based on descriptive features rely on object alignment to compute the similarity of objects for classification. This paper replaces the necessity of object alignment through sorting of feature.…

The hyperelastic materials would contribute to the intricacies of rough surface contact, primarily due to the heightened nonlinearity caused by stress concentration. In our previous research, an incremental contact model tailored for…

Analytical contact mechanics theories depend on surface roughness through the surface roughness power spectrum. In the present study, we evaluated the usability of various experimental methods for studying surface roughness. Our findings…

The interaction between a rapidly oscillating atomic force microscope tip and a soft material surface is described using both elastic and viscous forces with a moving surface model. We derive the simplest form of this model, motivating it…

Atomic force microscopy (AFM) is a key tool for characterising nanoscale structures, with functionalised tips now offering detailed images of the atomic structure. In parallel, AFM simulations using the particle probe model provide a…

Deformation theory is treated for locally notherian formal schemes (non necessarily smooth). The cotangent complex is defined in the derived category through the homology localization functor. The basic properties and results of a…

The measurement of real contact area between rough surfaces is one of most challenge problems in contact mechanics and is of importance to understand some physical mechanisms in tribology. Based on the frustrated total internal reflection,…

Given a manifold $M$ endowed with a contact 1-form $\alpha$, a bi-invariant pseudo-metric $\varrho_\alpha$ is introduced on $Cont(M,\alpha)$, the compactly supported identity component of the group of all strict contactomorphisms of…

Deformable shape modeling approaches that describe objects in terms of their medial axis geometry (e.g., m-reps [Pizer et al., 2003]) yield rich geometrical features that can be useful for analyzing the shape of sheet-like biological…

Forces acting between an Atomic Force Microscope (AFM) tip and sample are three dimensional. Despite this, most AFM force measurements are confined to one or two dimensions. Extending AFM force measurements into three dimensions has…

Ferroelectric domain imaging with piezoresponse force microscopy (PFM) relies on the converse piezoelectric effect: a voltage applied to the sample leads to mechanical deformations. In case of PFM one electrode is realized by the tip,…

We model numerically the partial normal contact of two elastic rough surfaces with highly correlated asperities. Facing surfaces are unmated and described as self-affine with a Hurst exponent H. The numerical algorithm is based on Fourier…

We elaborate on a deconvolution method, used to estimate the empirical distribution of unknown parameters, as suggested recently by Efron (2013). It is applied to estimating the empirical distribution of the 'sampling probabilities' of m…

The topography and the electrical properties are two crucial characteristics in determining roles and functionalities of materials. Conductive atomic force microscopy (CAFM) is widely recognized for its ability to independently measure the…

Quantifying the tip-sample interaction at the nanoscale in Amplitude Modulation mode AFM is challenging, especially when measuring in liquids. Here, we derive formulas for the tip-sample conservative and dissipative interactions and…

We introduce a corrective function to compensate errors in contact area computations coming from mesh discretization. The correction is based on geometrical arguments and requires only one additional quantity to be computed: the length of…

An approach is proposed for recovering affine correspondences (ACs) from orientation- and scale-invariant, e.g. SIFT, features. The method calculates the affine parameters consistent with a pre-estimated epipolar geometry from the point…

We derive an analytic expression for the height correlation function of a rough surface based on the inverse wave scattering method of Kirchhoff theory. The expression directly relates the height correlation function to diffuse scattered…

We start investigating the extension of the Horizon Quantum Mechanics to the case of spheroidal sources. We first study the location of trapping surfaces in space-times resulting from an axial deformation of static isotropic systems, and…