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相关论文: Atomic force microscope nanolithography of graphen…

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We use an atomic force microscope (AFM) to manipulate graphene films on a nanoscopic length scale. By means of local anodic oxidation with an AFM we are able to structure isolating trenches into single-layer and few-layer graphene flakes,…

介观与纳米尺度物理 · 物理学 2008-08-05 A. J. M. Giesbers , U. Zeitler , S. Neubeck , F. Freitag , K. S. Novoselov , J. C. Maan

The conductance of graphene nanoribbons and nanoconstrictions under the effect of a scanning gate microscopy tip is systematically studied. Using a scattering approach for noninvasive probes, the first- and second-order conductance…

介观与纳米尺度物理 · 物理学 2023-02-20 Xianzhang Chen , Guillaume Weick , Dietmar Weinmann , Rodolfo A. Jalabert

Nanoscale electronic transport gives rise to a number of intriguing physical phenomena that are accompanied by distinct spatial patterns of current flow. Here, we report on sensitive magnetic imaging of two-dimensional current distributions…

介观与纳米尺度物理 · 物理学 2022-06-17 M. L. Palm , W. S. Huxter , P. Welter , S. Ernst , P. J. Scheidegger , S. Diesch , K. Chang , P. Rickhaus , T. Taniguchi , K. Wantanabe , K. Ensslin , C. L. Degen

We report low-temperature transport spectroscopy of a graphene quantum dot fabricated by atomic force microscope nanolithography. The excellent spatial resolution of the atomic force microscope allows us to reliably fabricate quantum dots…

介观与纳米尺度物理 · 物理学 2013-12-02 R. K. Puddy , C. J. Chua , M. R. Buitelaar

Here we report on low temperature transport measurements of encapsulated bilayer graphene nano constrictions fabricated employing electrode-free AFM-based local anodic oxidation (LAO) nanolithography. This technique allows for the creation…

Patterning graphene into various mesoscopic devices such as nanoribbons, quantum dots, etc. by lithographic techniques has enabled the guiding and manipulation of graphene's Dirac-type charge carriers. Graphene, with well-defined strain…

介观与纳米尺度物理 · 物理学 2017-06-09 Péter Nemes-Incze , Gergő Kukucska , János Koltai , Jenő Kürti , Chanyong Hwang , Levente Tapasztó , László P. Biró

We have performed scanning gate microscopy (SGM) on graphene field effect transistors (GFET), using a biased metallic nanowire coated with a dielectric layer as a contact mode tip and local top gate. Electrical transport through graphene at…

Since its first isolation in 2004, graphene has been found to host a plethora of unusual electronic transport phenomena, making it a fascinating system for fundamental studies in condensed-matter physics as well as offering tremendous…

Graphene nanoribbons' electronic transport properties strongly depend on the type of edge, armchair, zigzag or other, and on edge functionalization that can be used for band-gap engineering. For only partly hydrogenated edges interesting…

介观与纳米尺度物理 · 物理学 2021-11-12 Sebastian Schneider , Regina Hoffmann-Vogel

We use a cooled Scanning Probe Microscope (SPM) to electron motion in nanoscale devices. The charged tip of the SPM is raster scanned at a constant height above the surface as the conductance of the device is measured. The image charge…

介观与纳米尺度物理 · 物理学 2017-03-08 Sagar Bhandari , Gil-Ho Lee , Philip Kim , Robert M. Westervelt

Graphene grown by chemical vapour deposition is transferred on top of flat gold nanoislands and characterized by scanning tunnelling microscopy (STM) and atomic force microscopy (AFM). Graphene bubbles are formed with lateral dimensions…

介观与纳米尺度物理 · 物理学 2016-09-15 András Pálinkás , György Molnár , Chanyong Hwang , László Péter Biró , Zoltán Osváth

We demonstrate the local oxidation nanopatterning of graphene films by an atomic force microscope. The technique provides a method to form insulating trenches in graphene flakes and to fabricate nanodevices with sub-nm precision. We…

介观与纳米尺度物理 · 物理学 2009-11-13 Lishan Weng , Liyuan Zhang , Yong P. Chen , Leonid P. Rokhinson

Measuring degeneracy and broken-symmetry states of a system at nanoscale requires extremely high energy and spatial resolution, which has so far eluded direct observation. Here, we realize measurement of the degeneracy and subtle…

介观与纳米尺度物理 · 物理学 2018-10-10 Si-Yu Li , Ya-Ning Ren , Yi-Wen Liu , Ming-Xing Chen , Hua Jiang , Lin He

Electronic current densities can reach extreme values in highly conducting nanostructures where constrictions limit current. For bias voltages on the 1 volt scale, the highly non-equilibrium situation can influence the electronic density…

介观与纳米尺度物理 · 物理学 2019-07-17 Susanne Leitherer , Nick Papior , Mads Brandbyge

An atomic force microscope is used to structure a film of multilayer graphene. The resistance of the sample was measured in-situ during nanomachining a narrow trench. We found a reversible behavior in the electrical resistance which we…

介观与纳米尺度物理 · 物理学 2008-07-28 P. Barthold , T. Luedtke , R. J. Haug

We have used scanning gate microscopy to explore the local conductivity of a current-annealed graphene flake. A map of the local neutrality point (NP) after annealing at low current density exhibits micron-sized inhomogeneities. Broadening…

介观与纳米尺度物理 · 物理学 2010-03-31 M. R. Connolly , K. L. Chiou , C. G. Smith , D. Anderson , G. A. C. Jones , A. Lombardo , A. Fasoli , A. C. Ferrari

Recent experiments reveal that a scanning tunneling microscopy (STM) probe tip can generate a highly localized strain field in a graphene drumhead, which in turn leads to pseudomagnetic fields in the graphene that can spatially confine…

Opto-electronic devices utilizing graphene have already demonstrated unique capabilities, which are much more difficult to realize with conventional technologies. However, the requirements in terms of material quality and uniformity are…

Elastic deformations of graphene can significantly change the flow paths and valley polarization of the electric currents. We investigate these phenomena in graphene nanoribbons with localized out-of-plane deformations by means of…

介观与纳米尺度物理 · 物理学 2019-03-12 Thomas Stegmann , Nikodem Szpak

Research in semiconductor physics has advanced to the study of two-dimensional (2D) materials where the surface controls electronic transport. A scanning probe microscope (SPM) is an ideal tool to image electronic motion in these devices by…

介观与纳米尺度物理 · 物理学 2017-02-01 Sagar Bhandari , Robert M. Westervelt
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