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Physically unclonable functions (PUFs) are used as low-cost cryptographic primitives in device authentication and secret key creation. SRAM-PUFs are well-known as entropy sources; nevertheless, due of non-deterministic noise environment…

In-memory computing technology is used extensively in artificial intelligence devices due to lower power consumption and fast calculation of matrix-based functions. The development of such a device and its integration in a system takes a…

We propose a memory-model-aware static program analysis method for accurately analyzing the behavior of concurrent software running on processors with weak consistency models such as x86-TSO, SPARC-PSO, and SPARC-RMO. At the center of our…

Process variations are a major concern in today's chip design since they can significantly degrade chip performance. To predict such degradation, existing circuit and MEMS simulators rely on Monte Carlo algorithms, which are typically too…

Because of constraints imposed by the market, embedded software in consumer electronics is almost inevitably shipped with faults and the goal is just to reduce the inherent unreliability to an acceptable level before a product has to be…

Deep learning-based semiconductor defect inspection has gained traction in recent years, offering a powerful and versatile approach that provides high accuracy, adaptability, and efficiency in detecting and classifying nano-scale defects.…

Resilient algorithms in high-performance computing are subject to rigorous non-functional constraints. Resiliency must not increase the runtime, memory footprint or I/O demands too significantly. We propose a task-based soft error detection…

Compute-in-memory (CiM) architectures promise significant improvements in energy efficiency and throughput for deep neural network acceleration by alleviating the von Neumann bottleneck. However, their reliance on emerging non-volatile…

Various methods for designing input features have been proposed for fault recognition in rotating machines using one-dimensional raw sensor data. The available methods are complex, rely on empirical approaches, and may differ depending on…

The medical device industry has significantly advanced by integrating sophisticated electronics like microchips and field-programmable gate arrays (FPGAs) to enhance the safety and usability of life-saving devices. These complex…

In-memory computing is a promising alternative to traditional computer designs, as it helps overcome performance limits caused by the separation of memory and processing units. However, many current approaches struggle with unreliable…

Bottleneck evaluation plays a crucial part in performance tuning of HPC applications, as it directly influences the search for optimizations and the selection of the best hardware for a given code. In this paper, we introduce a new…

Memory safety remains a critical and widely violated property in reality. Numerous defense techniques have been proposed and developed but most of them are not applied or enabled by default in production-ready environment due to their…

Design For Manufacturing (DFM) approaches aim to integrate manufacturability aspects during the design stage. Most of DFM approaches usually consider only one manufacturing process, but products competitiveness may be improved by designing…

Real-space mapping of doping concentration in semiconductor devices is of great importance for the microelectronic industry. In this work, a scanning microwave impedance microscope (MIM) is employed to resolve the local conductivity…

We developed a 55 nm CMOS SRAM chip that scans all data every 125 ns and outputs timestamped soft error data via an SPI interface through a FIFO. The proposed system, consisting of the developed chip and particle detectors, enables…

A growing need exists for efficient and accurate methods for detecting defects in semiconductor materials and devices. These defects can have a detrimental impact on the efficiency of the manufacturing process, because they cause critical…

Synchronous Mirroring (SM) is a standard approach to building highly-available and fault-tolerant enterprise storage systems. SM ensures strong data consistency by maintaining multiple exact data replicas and synchronously propagating every…

In industrial systems, certain process variables that need to be monitored for detecting faults are often difficult or impossible to measure. Soft sensor techniques are widely used to estimate such difficult-to-measure process variables…

Increasing storage density exacerbates DRAM read disturbance, a circuit-level vulnerability exploited by system-level attacks. Unfortunately, existing defenses are either ineffective or prohibitively expensive. Efficient mitigation is…