SPT-SLIM芯片滤波器谱仪的光谱表征与性能评估
天体物理仪器与方法
2025-10-09 v3 宇宙学与河外天体物理
摘要
南极天线望远镜Shirokoff Line Intensity Mapper（SPT-SLIM）实验是为了演示芯片谱仪在毫米波线强度映射中应用而设立的试探性项目。我们报告了在SPT-SLIM首次部署（2024-2025年南极夏季观测季节）期间，使用傅里叶变换光谱仪对SLIM谱仪通道进行的光谱带宽测量。通过该方法，我们展示了一种测量SPT-SLIM滤波器带宽的技术，超越了傅里叶变换光谱仪的固有分辨率。
引用
@article{arxiv.2509.02245,
title = {Spectral characterization and performance of SPT-SLIM on-chip filterbank spectrometers},
author = {C. S. Benson and K. Fichman and M. Adamic and A. J. Anderson and P. S. Barry and B. A. Benson and E. Brooks and J. E. Carlstrom and T. Cecil and C. L. Chang and K. R. Dibert and M. Dobbs and K. S. Karkare and G. K. Keating and A. M. Lapuente and M. Lisovenko and D. P. Marrone and J. Montgomery and T. Natoli and Z. Pan and A. Rahlin and G. Robson and M. Rouble and G. Smecher and V. Yefremenko and M. R. Young and C. Yu and J. A. Zebrowski and C. Zhang},
journal= {arXiv preprint arXiv:2509.02245},
year = {2025}
}