Patterson Function from Low-Energy Electron Diffraction Measured Intensities and Structural Discrimination
摘要
Surface Patterson Functions have been derived by direct inversion of experimental Low-Energy Electron Diffraction I-V spectra measured at multiple incident angles. The direct inversion is computationally simple and can be used to discriminate between different structural models. 1x1 YSi_2 epitaxial layers grown on Si(111) have been used to illustrate the analysis. We introduce a suitable R-factor for the Patterson Function to make the structural discrimination as objective as possible. From six competing models needed to complete the geometrical search, four could easily be discarded, achieving a very significant and useful reduction in the parameter space to be explored by standard dynamical LEED methods. The amount and quality of data needed for this analysis is discussed.
引用
@article{arxiv.cond-mat/0212359,
title = {Patterson Function from Low-Energy Electron Diffraction Measured Intensities and Structural Discrimination},
author = {Celia Rogero and Jose-Angel Martin-Gago and Pedro L. de Andres},
journal= {arXiv preprint arXiv:cond-mat/0212359},
year = {2009}
}
备注
5 pages, 4 figures