毫米波频段可重构智能表面的路径损耗建模与测量
摘要
可重构智能表面(RISs)提供了无线传播环境的电磁世界与信息科学的数字世界之间的接口。简单且足够精确的RIS路径损耗模型是RIS辅助无线通信系统理论分析与优化的基础。本文中，我们精炼先前提出的RIS自由空间路径损耗模型，使其更简单、更适用、更易用。发射机、接收机及RIS单元天线的方向性对路径损耗的影响被明确表述为角度相关损耗因子。精炼模型对由深亚波长尺寸单元构成的RIS路径损耗给出了更精确的估计。基于所提模型，从散射性能、功耗与面积方面评估了单单元特性，从而揭示了高频段部署RIS的基本考量。利用两个工作在毫米波(mmWave)频段的 fabricated RISs 开展测量活动。测量结果显示与所提路径损耗模型吻合良好。此外，实验结果提示了一种用于路径损耗建模的单元功率辐射方向图的有效表征形式。
引用
@article{arxiv.2101.08607,
title = {Path Loss Modeling and Measurements for Reconfigurable Intelligent Surfaces in the Millimeter-Wave Frequency Band},
author = {Wankai Tang and Xiangyu Chen and Ming Zheng Chen and Jun Yan Dai and Yu Han and Marco Di Renzo and Shi Jin and Qiang Cheng and Tie Jun Cui},
journal= {arXiv preprint arXiv:2101.08607},
year = {2022}
}
备注
Model refinements are introduced to previously proposed free-space path loss model for RISs in order to make it simpler and easier to use. The properties of a single unit cell are evaluated in terms of scattering performance, power, and area, as it is the basic element of an RIS. We report the world's first measurement campaign in the mmWave frequency band to validate the path loss model for RISs