用于中性 $\pi$ 介子辐射宽度精密测量的核靶
核实验
2009-12-08 v1
摘要
本文提出了一种技术，用于精密测量在 Jefferson 实验室测量中性 介子辐射宽度的实验中所使用的约5%辐射长度碳靶和 208Pb 靶的面密度 density * T。碳靶面密度的测量精度为 +/- 0.050%，通过 X 射线衰减技术获得的铅靶精度为 +/- 0.43%。
引用
@article{arxiv.0811.2132,
title = {Nuclear Targets for a Precision Measurement of the Neutral Pion Radiative Width},
author = {P. Martel and E. Clinton and R. McWilliams and D. Lawrence and R. Miskimen and A. Ahmidouch and P. Ambrozewicz and A. Asratyan and K. Baker and L. Benton and A. Bernstein and P. Cole and P. Collins and D. Dale and S. Danagoulian and G. Davidenko and R. Demirchyan and A. Deur and A. Dolgolenko and G. Dzyubenko and A. Evdokimov and J. Feng and M. Gabrielyan and L. Gan and A. Gasparian and O. Glamazdin and V. Goryachev and V. Gyurjyan and K. Hardy and M. Ito and M. Khandaker and P. Kingsberry and A. Kolarkar and M. Konchatnyi and O. Korchin and W. Korsch and S. Kowalski and M. Kubantsev and V. Kubarovsky and I. Larin and V. Matveev and D. McNulty and B. Milbrath and R. Minehart and V. Mochalov and S. Mtingwa and I. Nakagawa and S. Overby and E. Pasyuk and M. Payen and R. Pedroni and Y. Prok and B. Ritchie and C. Salgado and A. Sitnikov and D. Sober and W. Stephens and A. Teymurazyan and J. Underwood and A. Vasiliev and V. Verebryusov and V. Vishnyakov and M. Wood},
journal= {arXiv preprint arXiv:0811.2132},
year = {2009}
}