来自SuperCDMS HVeV探测器的暗物质约束——地下实验与反冲事件选择
高能物理 - 实验
2025-05-26 v4 宇宙学与河外天体物理
仪器与探测器
摘要
本文报告了首次在多台SuperCDMS HVeV探测器地下实验中获得的暗物质-电子相互作用约束。实验暴露量为7.63克-天，对暗物质质量在0.5至1000MeV/范围内的暗物质-电子散射截面积设定了上限；同时对暗光子动力学混合及类似轴子的轴电偶性耦合（质量在1.2至23.3eV/）也给出上限。与早先的HVeV搜索相比，由于增加了225米水当量的深度覆盖、反冲事件选择以及更好的pile-up抑制，灵敏度得到提升。对于通过重质介质介导的暗物质-电子散射，截面灵敏度提升了最高可达25倍。
引用
@article{arxiv.2407.08085,
title = {Light Dark Matter Constraints from SuperCDMS HVeV Detectors Operated Underground with an Anticoincidence Event Selection},
author = {SuperCDMS Collaboration and M. F. Albakry and I. Alkhatib and D. Alonso-González and D. W. P. Amaral and J. Anczarski and T. Aralis and T. Aramaki and I. J. Arnquist and I. Ataee Langroudy and E. Azadbakht and C. Bathurst and R. Bhattacharyya and A. J. Biffl and P. L. Brink and M. Buchanan and R. Bunker and B. Cabrera and R. Calkins and R. A. Cameron and C. Cartaro and D. G. Cerdeño and Y. -Y. Chang and M. Chaudhuri and J. -H. Chen and R. Chen and N. Chott and J. Cooley and H. Coombes and P. Cushman and R. Cyna and S. Das and F. De Brienne and S. Dharani and M. L. di Vacri and M. D. Diamond and M. Elwan and E. Fascione and E. Figueroa-Feliciano and K. Fouts and M. Fritts and R. Germond and M. Ghaith and S. R. Golwala and J. Hall and S. A. S. Harms and K. Harris and N. Hassan and Z. Hong and E. W. Hoppe and L. Hsu and M. E. Huber and V. Iyer and D. Jardin and V. K. S. Kashyap and S. T. D. Keller and M. H. Kelsey and K. T. Kennard and A. Kubik and N. A. Kurinsky and M. Lee and J. Leyva and J. Liu and Y. Liu and B. Loer and E. Lopez Asamar and P. Lukens and D. B. MacFarlane and R. Mahapatra and J. S. Mammo and N. Mast and A. J. Mayer and H. Meyer zu Theenhausen and É. Michaud and E. Michielin and N. Mirabolfathi and M. Mirzakhani and B. Mohanty and D. Monteiro and J. Nelson and H. Neog and V. Novati and J. L. Orrell and M. D. Osborne and S. M. Oser and L. Pandey and S. Pandey and R. Partridge and D. S. Pedreros and W. Peng and L. Perna and W. L. Perry and R. Podviianiuk and S. S. Poudel and A. Pradeep and M. Pyle and W. Rau and E. Reid and R. Ren and T. Reynolds and M. Rios and A. Roberts and A. E. Robinson and J. L. Ryan and T. Saab and D. Sadek and B. Sadoulet and S. P. Sahoo and I. Saikia and J. Sander and A. Sattari and B. Schmidt and R. W. Schnee and S. Scorza and B. Serfass and A. Simchony and D. J. Sincavage and P. Sinervo and J. Street and H. Sun and E. Tanner and G. D. Terry and D. Toback and S. Verma and A. N. Villano and B. von Krosigk and S. L. Watkins and O. Wen and Z. Williams and M. J. Wilson and J. Winchell and K. Wykoff and S. Yellin and B. A. Young and T. C. Yu and B. Zatschler and S. Zatschler and A. Zaytsev and E. Zhang and L. Zheng and A. Zuniga and M. J. Zurowski},
journal= {arXiv preprint arXiv:2407.08085},
year = {2025}
}
备注
7 pages + title and references, 4 figures, and 1 table