InAs-Al 混合器件中的干涉单次奇偶性测量
介观与纳米尺度物理
2025-09-09 v4
摘要
非阿贝尔任意子或拓扑缺陷的融合是仅测量拓扑量子计算中的一项基本操作。在拓扑超导体中，该操作相当于确定 Majorana 零模的共享费米子奇偶性。作为迈向这一步的进展，我们在具有门定义纳米线的砷化铟 - 铝异质结构中实现了费米子奇偶性的单次干涉测量。干涉仪由近端纳米线与量子点隧穿耦合形成。该纳米线导致这些量子点的量子电容产生高达 1 fF 的态依赖偏移。我们的量子电容测量显示出磁通 周期的双模性，在最佳磁通值下，信噪比为 1，耗时 3.7 s。从量子电容测量的时间轨迹中，我们提取出在约 2 T 的面内磁场下，两个相关态的停留时间长于 1 ms。这些结果与对一对相距约 3 m 且受非平衡准粒子低速率毒化影响的 Majorana 零模所编码的费米子奇偶性的测量一致。大的电容偏移和长的毒化时间使得奇偶性测量错误概率仅为 1%。
引用
@article{arxiv.2401.09549,
title = {Interferometric Single-Shot Parity Measurement in an InAs-Al Hybrid Device},
author = {Morteza Aghaee and Alejandro Alcaraz Ramirez and Zulfi Alam and Rizwan Ali and Mariusz Andrzejczuk and Andrey Antipov and Mikhail Astafev and Amin Barzegar and Bela Bauer and Jonathan Becker and Umesh Kumar Bhaskar and Alex Bocharov and Srini Boddapati and David Bohn and Jouri Bommer and Leo Bourdet and Arnaud Bousquet and Samuel Boutin and Lucas Casparis and Benjamin James Chapman and Sohail Chatoor and Anna Wulff Christensen and Cassandra Chua and Patrick Codd and William Cole and Paul Cooper and Fabiano Corsetti and Ajuan Cui and Paolo Dalpasso and Juan Pablo Dehollain and Gijs de Lange and Michiel de Moor and Andreas Ekefjärd and Tareq El Dandachi and Juan Carlos Estrada Saldaña and Saeed Fallahi and Luca Galletti and Geoff Gardner and Deshan Govender and Flavio Griggio and Ruben Grigoryan and Sebastian Grijalva and Sergei Gronin and Jan Gukelberger and Marzie Hamdast and Firas Hamze and Esben Bork Hansen and Sebastian Heedt and Zahra Heidarnia and Jesús Herranz Zamorano and Samantha Ho and Laurens Holgaard and John Hornibrook and Jinnapat Indrapiromkul and Henrik Ingerslev and Lovro Ivancevic and Thomas Jensen and Jaspreet Jhoja and Jeffrey Jones and Konstantin V. Kalashnikov and Ray Kallaher and Rachpon Kalra and Farhad Karimi and Torsten Karzig and Evelyn King and Maren Elisabeth Kloster and Christina Knapp and Dariusz Kocon and Jonne Koski and Pasi Kostamo and Mahesh Kumar and Tom Laeven and Thorvald Larsen and Jason Lee and Kyunghoon Lee and Grant Leum and Kongyi Li and Tyler Lindemann and Matthew Looij and Julie Love and Marijn Lucas and Roman Lutchyn and Morten Hannibal Madsen and Nash Madulid and Albert Malmros and Michael Manfra and Devashish Mantri and Signe Brynold Markussen and Esteban Martinez and Marco Mattila and Robert McNeil and Antonio B. Mei and Ryan V. Mishmash and Gopakumar Mohandas and Christian Mollgaard and Trevor Morgan and George Moussa and Chetan Nayak and Jens Hedegaard Nielsen and Jens Munk Nielsen and William Hvidtfelt Padkær Nielsen and Bas Nijholt and Mike Nystrom and Eoin O'Farrell and Thomas Ohki and Keita Otani and Brian Paquelet Wütz and Sebastian Pauka and Karl Petersson and Luca Petit and Dima Pikulin and Guen Prawiroatmodjo and Frank Preiss and Eduardo Puchol Morejon and Mohana Rajpalke and Craig Ranta and Katrine Rasmussen and David Razmadze and Outi Reentila and David J. Reilly and Yuan Ren and Ken Reneris and Richard Rouse and Ivan Sadovskyy and Lauri Sainiemi and Irene Sanlorenzo and Emma Schmidgall and Cristina Sfiligoj and Mustafeez Bashir Shah and Kevin Simoes and Shilpi Singh and Sarat Sinha and Thomas Soerensen and Patrick Sohr and Tomas Stankevic and Lieuwe Stek and Eric Stuppard and Henri Suominen and Judith Suter and Sam Teicher and Nivetha Thiyagarajah and Raj Tholapi and Mason Thomas and Emily Toomey and Josh Tracy and Michelle Turley and Shivendra Upadhyay and Ivan Urban and Kevin Van Hoogdalem and David J. Van Woerkom and Dmitrii V. Viazmitinov and Dominik Vogel and John Watson and Alex Webster and Joseph Weston and Georg W. Winkler and Di Xu and Chung Kai Yang and Emrah Yucelen and Roland Zeisel and Guoji Zheng and Justin Zilke},
journal= {arXiv preprint arXiv:2401.09549},
year = {2025}
}
备注
Added data on a second measurement of device A and a measurement of device B, expanded discussion of a trivial scenario. Refs added, author list updated