Interface Scaling in the Contact Process
统计力学
2009-10-31 v1
摘要
Scaling properties of an interface representation of the critical contact process are studied in dimensions 1 - 3. Simulations confirm the scaling relation beta_W = 1 - theta between the interface-width growth exponent beta_W and the exponent theta governing the decay of the order parameter. A scaling property of the height distribution, which serves as the basis for this relation, is also verified. The height-height correlation function shows clear signs of anomalous scaling, in accord with Lopez' analysis [Phys. Rev. Lett. 83, 4594 (1999)], but no evidence of multiscaling.
引用
@article{arxiv.cond-mat/0003480,
title = {Interface Scaling in the Contact Process},
author = {Ronald Dickman and Miguel A. Munoz},
journal= {arXiv preprint arXiv:cond-mat/0003480},
year = {2009}
}
备注
10 pages, 9 figures