Euclid：CMOS非线性活性像素传感器IPC校正转换增益的 methodology
仪器与探测器
2026-01-21 v1 天体物理仪器与方法
摘要
我们提出一种快速测量补充金属氧化物-半导体器件（CMOS）活性像素传感器（APS）转换增益的方法，能够考虑非线性效应和像素间电容（interpixel capacitance, IPC）。标准的“均值-方差”方法存在偏差，因为其假设像素值对信号呈线性依赖，而现有纠正非线性的方法仍引入显著偏差。虽然当前的IPC校正方法在逐像素应用方面仍禁用于速度，但我们新方法利用单独测量IPC核来实现几乎瞬时计算增益。通过验证ESA Euclid任务的飞行探测器测试数据，我们发现IPC校正在0.1%精度内恢复了较慢方法的结果。与此同时，非线性校正确保增益估计独立于信号，纠正了超过2.5%的增益估计偏差。
关键词
引用
@article{arxiv.2509.08810,
title = {Euclid: Methodology for derivation of IPC-corrected conversion gain of nonlinear CMOS APS},
author = {J. Le Graet and A. Secroun and M. Tourneur-Silvain and W. Gillard and N. Fourmanoit and S. Escoffier and E. Kajfasz and S. Kermiche and B. Kubik and J. Zoubian and S. Andreon and M. Baldi and S. Bardelli and P. Battaglia and D. Bonino and E. Branchini and M. Brescia and J. Brinchmann and A. Caillat and S. Camera and V. Capobianco and C. Carbone and J. Carretero and S. Casas and M. Castellano and G. Castignani and S. Cavuoti and A. Cimatti and C. Colodro-Conde and G. Congedo and C. J. Conselice and L. Conversi and Y. Copin and F. Courbin and H. M. Courtois and A. Da Silva and J. Dinis and M. Douspis and F. Dubath and C. A. J. Duncan and X. Dupac and S. Dusini and A. Ealet and M. Farina and S. Farrens and F. Faustini and S. Ferriol and M. Frailis and E. Franceschi and S. Galeotta and B. Gillis and C. Giocoli and F. Grupp and S. V. H. Haugan and W. Holmes and F. Hormuth and A. Hornstrup and P. Hudelot and K. Jahnke and M. Jhabvala and A. Kiessling and M. Kilbinger and R. Kohley and H. Kurki-Suonio and P. B. Lilje and V. Lindholm and I. Lloro and G. Mainetti and D. Maino and E. Maiorano and O. Mansutti and O. Marggraf and K. Markovic and N. Martinet and F. Marulli and R. Massey and E. Medinaceli and S. Mei and M. Meneghetti and G. Meylan and M. Moresco and L. Moscardini and S. -M. Niemi and J. W. Nightingale and C. Padilla and S. Paltani and F. Pasian and K. Pedersen and V. Pettorino and S. Pires and G. Polenta and M. Poncet and L. A. Popa and F. Raison and A. Renzi and J. Rhodes and G. Riccio and E. Romelli and M. Roncarelli and E. Rossetti and R. Saglia and D. Sapone and B. Sartoris and J. A. Schewtschenko and M. Schirmer and G. Seidel and M. Seiffert and C. Sirignano and G. Sirri and L. Stanco and J. Steinwagner and P. Tallada-Crespí and D. Tavagnacco and A. N. Taylor and H. I. Teplitz and I. Tereno and R. Toledo-Moreo and F. Torradeflot and I. Tutusaus and L. Valenziano and T. Vassallo and A. Veropalumbo and Y. Wang and J. Weller},
journal= {arXiv preprint arXiv:2509.08810},
year = {2026}
}