利用回旋辐射发射光谱学测定中微子质量——Project 8
仪器与探测器
2017-03-31 v1 高能物理 - 实验
核实验
摘要
确定绝对中微子质量最灵敏的直接方法是观测氚贝塔衰变谱的终点。回旋辐射发射光谱学（CRES）是一种精密光谱技术，能以 eV 量级的分辨率探测大部分尚未探索的中微子质量范围。中微子振荡观测设定了 m(ν_e) ≳ 9(0.1) meV 的下限，而当前一代基于静电磁绝热准直（MAC-E）滤波器的氚贝塔衰变实验——KATRIN 实验——将达到 m(ν_e) ≲ 0.2 eV 的灵敏度。CRES 技术旨在避免扩大基于 MAC-E 滤波器的实验以获得更低质量灵敏度时所面临的困难。本文回顾了 CRES 技术的现状，并介绍了 Project 8，这是一个分阶段进行的绝对中微子质量实验，有潜力利用原子氚源达到低至 m(ν_e) ≲ 40 meV 的灵敏度。
引用
@article{arxiv.1703.02037,
title = {Determining the neutrino mass with Cyclotron Radiation Emission Spectroscopy - Project 8},
author = {Ali Ashtari Esfahani and David M. Asner and Sebastian Böser and Raphael Cervantes and Christine Claessens and Luiz de Viveiros and Peter J. Doe and Shepard Doeleman and Justin L. Fernandes and Martin Fertl and Erin C. Finn and Joseph A. Formaggio and Daniel Furse and Mathieu Guigue and Karsten M. Heeger and A. Mark Jones and Kareem Kazkaz and Jared A. Kofron and Callum Lamb and Benjamin H. LaRoque and Eric Machado and Elizabeth L. McBride and Michael L. Miller and Benjamin Monreal and Prajwal Mohanmurthy and James A. Nikkel and Noah S. Oblath and Walter C. Pettus and R. G. Hamish Robertson and Leslie J. Rosenberg and Gray Rybka and Devyn Rysewyk and Luis Saldaña and Penny L. Slocum and Matthew G. Sternberg and Jonathan R. Tedeschi and Thomas Thümmler and Brent A. VanDevender and Laura E. Vertatschitsch and Megan Wachtendonk and Jonathan Weintroub and Natasha L. Woods and André Young and Evan M. Zayas},
journal= {arXiv preprint arXiv:1703.02037},
year = {2017}
}
备注
19 pages, 8 figures, to be published in Journal of Physics G