中文

丙烯酸表面上的 $^{222}$Rn 污染机制

仪器与探测器 2019-11-13 v1

摘要

本工作研究了丙烯酸表面上的 222^{222}Rn 污染机制。222^{222}Rn 对于低本底实验可构成显著的本底来源,而丙烯酸因其纯度和透明性成为探测器设计的合适材料。四个丙烯酸样品被暴露于富含 222^{222}Rn 的环境中不同时间段,从而被 222^{222}Rn 及其子体污染。随后,通过 α\alphaγ\gamma 测量评估了样品上放射性污染物活度随时间的变化,突出了不同衰变模式在污染过程中的作用。对 alpha 能谱的详细分析得以量化污染物的注入深度。此外,对 α\alphaγ\gamma 测量的研究指出了 222^{222}Rn 在样品内部的扩散。

关键词

引用

@article{arxiv.1911.04836,
  title  = {$^{222}$Rn contamination mechanisms on acrylic surfaces},
  author = {M. Nastasi and A. Paonessa and E. Previtali and E. Quadrivi and M. Sisti and S. Aiello and G. Andronico and V. Antonelli and W. Baldini and M. Bellato and A. Bergnoli and A. Brigatti and R. Brugnera and A. Budano and M. Buscemi and A. Cammi and R. Caruso and D. Chiesa and C. Clementi and D. Corti and S. Costa and F. Dal Corso and X. F. Ding and S. Dusini and A. Fabbri and G. Fiorentini and R. Ford and A. Formozov and G. Galet and A. Garfagnini and M. Giammarchi and A. Giaz and M. Grassi and R. Isocrate and C. Landini and I. Lippi and P. Lombardi and Y. Malyshkin and F. Mantovani and S. M. Mari and F. Marini and C. Martellini and A. Martini and E. Meroni and M. Mezzetto and L. Miramonti and P. Montini and M. Montuschi and F. Ortica and A. Paoloni and S. Parmeggiano and N. Pelliccia and G. Ranucci and A. C. Re and B. Ricci and A. Romani and P. Saggese and G. Salamanna and F. H. Sawi and A. Serafini and G. Settanta and C. Sirignano and L. Stanco and V. Strati and C. Tuvè and G. Verde and L. Votano},
  journal= {arXiv preprint arXiv:1911.04836},
  year   = {2019}
}