English

Raman microspectroscopic characterization of amorphous silica plastic behavior

Other Condensed Matter 2016-08-16 v2

Abstract

Raman microspectroscopy was used to characterize amorphous silica plastic behavior. Using a correlation between Raman spectrum and density, a map of the local residual indentation-induced densification is obtained. The existence of a densification-induced hardening is also evidenced through a diamond anvil cell experiment. Such observations are not accounted for by the previously proposed hardening-free pressure-dependent yield criterion based on indentation curves. These results open the way to more accurate description of a constitutive law for amorphous silica.

Keywords

Cite

@article{arxiv.cond-mat/0409726,
  title  = {Raman microspectroscopic characterization of amorphous silica plastic behavior},
  author = {Antoine Perriot and Valérie Martinez and Laurent Grosvalet and Christine Martinet and Bernard Champagnon and Damien Vandembroucq and Etienne Barthel},
  journal= {arXiv preprint arXiv:cond-mat/0409726},
  year   = {2016}
}
R2 v1 2026-07-22T11:08:27.763Z