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We present an optical setup that can be used to characterize the thicknesses of thin NbN films to screen samples for fabrication and to better model the performance of the resulting superconducting nanowire single photon detectors. The…
Tin Sulphide is a layered compound which retains its structure when deposited as thin films by thermal evaporation. The films were found to have oriented growth with the direction of orientation changing with film thickness. The film's…
We investigate the effects of disorder characterising a superconducting thin film on the proximity-induced superconductivity generated by the film (in, e.g., a semiconductor) based on the exact numerical analysis of a three-dimensional…
Using the Cryogenic, High-Accuracy Refraction Measuring System (CHARMS) at NASA's Goddard Space Flight Center, we have measured the absolute refractive index of five specimens taken from a very large boule of Corning 7980 fused silica from…
We explore the potential of Time-Of-Flight Medium Energy Ion Scattering (TOFMEIS) for thin film analysis and analyze possible difficulties in evaluation of experimental spectra. Issues regarding different combinations of composition and…
The thermal emission of dust is one of the most important tracers of the interstellar medium: multi-wavelength photometry in the far-infrared (FIR) and submillimeter (submm) can be fitted with a model, providing estimates of the dust mass.…
In this paper we show how reliable measurements on porous ceramic films can be made by appropriate nanoindentation experiments and analysis. Room-temperature mechanical properties of the mixed-conducting perovskite material LSCF6428 were…
Low-energy electron microscopy (LEEM) was used to measure the reflectivity of low-energy electrons from graphitized SiC(0001). The reflectivity shows distinct quantized oscillations as a function of the electron energy and graphite…
A refractive index sensor based on a semicircular bent fiber is presented. The interference occurs between the cladding mode excited in the bending region and the core mode. Both the theoretical and experimental results show that the…
A simple electronic experiment with a field effect transistor type microstructure is suggested. The thin superconductor layer is the source-drain channel of the layered structure where an AC current is applied. It is necessary to measure…
A simple optical method is presented for identifying and measuring the effective optical properties of nanometer-thick, graphene-based materials, based on the use of substrates consisting of a thin dielectric layer on silicon. High contrast…
The interrogation of a sensor based on a highly birefringent film irradiated by an incident beam whose polarization is oriented 45o with respect to the normal film axes is shown to display exceptional features and resolve some outstanding…
During the dielectric breakdown process of thin solid-state nanopores, the application of high voltages may cause the formation of multi-nanopores on one chip, which number and sizes are important for their applications. Here, simulations…
Molecular spins are a versatile platform for quantum sensing. Not only are the spin-bearing molecules themselves widely tunable, they are also capable of being used as sensors as crystals, films and in solution. Using thin-films offers the…
Material absorption is a key limitation in nanophotonic systems; however, its characterization is often obscured by scattering and diffraction loss. Here we show that nanomechanical frequency spectroscopy can be used to characterize the…
The fabrication of complex nano-scale structures, which is a crucial step in the scaling of (nano) electronic devices, often leads to residual stress in the different layers present. This stress gradient can change many of the material…
For the first time it is shown that for thin metallic films thickness of which not exceed thickness of skin-layer, the problem allows analytical solution for arbitrary boundary value problems. The analysis of dependence of coefficients of…
We study the critical behavior of magnetic thin films as a function of the film thickness. We use the ferromagnetic Ising model with the high-resolution multiple histogram Monte Carlo (MC) simulation. We show that though the 2D behavior…
The wetting behavior of thin films of 4'-n-octyl-4-cyanobiphenyl (8CB) on Si is investigated via optical and x-ray reflectivity measurement. An experimental phase diagram is obtained showing a broad thick-thin coexistence region spanning…
Thin-film inspection on large-area substrates in coating manufacture remains a critical parameter to ensure product quality; however, extending the inspection process precisely over a large area presents major challenges, due to the…