A simple optical method is presented for identifying and measuring the effective optical properties of nanometer-thick, graphene-based materials, based on the use of substrates consisting of a thin dielectric layer on silicon. High contrast between the graphene-based materials and the substrate is obtained by choosing appropriate optical properties and thickness of the dielectric layer. The effective refractive index and optical absorption coefficient of graphene oxide, thermally reduced graphene oxide, and graphene are obtained by comparing the predicted and measured contrasts.
@article{arxiv.0706.0029,
title = {Simple approach for high-contrast optical imaging and characterization of graphene-based sheets},
author = {Inhwa Jung and Matthew Pelton and Richard Piner and Dmitriy A. Dikin and Sasha Stankovich and Supinda Watcharotone and Martina Hausner and Rodney S. Ruoff},
journal= {arXiv preprint arXiv:0706.0029},
year = {2015}
}
Comments
New measurements, calculations modified, discussion revised