Related papers: Depth resolution optimized sputter depth profiling…
Argon Gas Cluster-Ion Beam sources have become widely-used on x-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS) instruments in recent years, but there is little reference data on sputter yields in the…
Despite constituting a smaller fraction of the qubits electromagnetic mode, surfaces and interfaces can exert significant influence as sources of high-loss tangents, which brings forward the need to reveal properties of these extended…
Distinguishing signal of young gas rich circumstellar disks from stellar signal in near infrared light is a difficult task. Current techniques such as Angular Differential Imaging (ADI) and Polarimetric Differential Imaging (PDI) cope with…
The profile of suspended silicon nitride thin films patterned with one-dimensional subwavelength grating structures is investigated using Atomic Force Microscopy. We first show that the results of the profilometry can be used as input to…
Disk polarization at (sub)millimeter wavelengths is being revolutionized by ALMA observationally, but its origin remains uncertain. Dust scattering was recently recognized as a potential contributor to polarization, although its basic…
We report on a novel method for tuning and enhancing fluorescence from irradiated polystyrene through electron-beam exposure in gaseous environments. We describe the effect of electron dose and ambient gas on the photoluminescence spectra…
The reliability of perovskite material LSCF to be used as cathode parts in solid oxide fuel cells also relies on its mechanical properties. Adequate surface conditions are desired when the as-sintered porous thin films are subjected to…
A systematic experimental and theoretical study about substrate induced molecular conformation in rubrene thin films by varying film thickness from sub-monolayer to multilayer, which currently attracts substantial attention with regard to…
Laser cutting of semiconductor wafers and transparent dielectrics has become a dominant process in manufacturing industries, encompassing a wide range of applications from flat display panels to microelectronic chips. Limited by the…
In this paper, we introduce a novel artificial neural network (ANN) based scheme to estimate the thickness of thin films deposited on a given substrate. Here we consider the visible interference pattern between a plane wave and a diverging…
High-contrast scattered light observations have revealed the surface morphology of several dozens of protoplanetary disks at optical and near-infrared wavelengths. Inclined disks offer the opportunity to measure part of the phase function…
In this paper we report on the development and performance of a cylindrical mirror analyser electron spectrometer for ion atom collision experiments. A low cost data acquisition system using Arduino microcontroller has also been developed…
Many studies utilize dual-pixel (DP) sensor phase characteristics for various applications, such as depth estimation and deblurring. However, since the DP image features are entirely determined by the camera hardware, DP-depth paired…
We use cyclic spectroscopy to directly measure the scintillation parameter $C_1$ for the millisecond pulsar B1937+21. This marks the first time this constant has been measured for any pulsar without assuming a pulse broadening function…
The ion-sputtering induced intermixing is studied by molecular dynamics (MD) simulations and by Auger electron spectroscopy depth profiling (AES-DP) analysis in Pt/Ti/Si substrate (Pt/Ti) and Ta/Ti/Pt/Si substrate (Ti/Pt) multilayers.…
A series of MgB$_2$ thin films systematically disordered by neutron irradiation have been studied by Scanning Tunneling Spectroscopy. The c-axis orientation of the films allowed a reliable determination of local density of state of the…
This work demonstrates the viability of scandium oxide deposition on silicon by means of high pressure sputtering. Deposition pressure and radio frequency power are varied for optimization of the properties of the thin films and the ScOx-Si…
Layers with gradient refractive-index profile are an attractive alternative to conventional homogeneous stack coatings. However, the optical characterization and monitoring of the graded refractive-index profile is a complex issue, which…
X-ray diffractometers primarily designed for surface x-ray diffraction are often used to measure the diffraction from powders, textured materials, and fiber-texture samples in so-called $2\theta$ scans. Unlike high-energy powder diffraction…
Multiple scattering of waves in disordered media is a nightmare whether it be for detection or imaging purposes. The best approach so far to get rid of multiple scattering is optical coherence tomography. It basically combines confocal…