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Debris disks give us the unique opportunity to probe the properties of small $\mu$m-sized particles, allowing us to peer into the constituents of their parent bodies, young analogs of comets and asteroids of our solar system. In the past,…
When waves propagate through a complex medium, they undergo several scattering events. This phenomenon is detrimental to imaging, as it causes full blurring of the image. Here we describe a method for detecting, localizing and…
The superconducting critical temperature (Tc > 15K) of niobium titanium nitride (NbTiN) thin films allows for low-loss circuits up to 1.1 THz, enabling on-chip spectroscopy and multi-pixel imaging with advanced detectors. The drive for…
Estimating depth from images nowadays yields outstanding results, both in terms of in-domain accuracy and generalization. However, we identify two main challenges that remain open in this field: dealing with non-Lambertian materials and…
Microscopy and diffraction measurements are presented of ultrathin binary alloy films of ruthenium and molybdenum that are obtained by standard sputter deposition. For compositions close to Ru50Mo50, we find the films to be amorphous. The…
Nanoscale strain mapping by four-dimensional scanning transmission electron microscopy (4D-STEM) relies on determining the precise locations of Bragg-scattered electrons in a sequence of diffraction patterns, a task which is complicated by…
The nitrides of group III metals: AlN, GaN and InN are very important materials due to their applications for short wavelength opto-electronics (light-emitting diodes and laser diodes). It is essential for the realization of such novel…
X-ray reflectometry (XRR) provides researchers and manufacturers with a non-destructive way to determine thickness, roughness, and density of thin films deposited on smooth substrates. Due to the nested nature of equations modeling this…
Spectropolarimetry from the near IR to the far UV of light scattered by dust provides a valuable diagnostic of the dust composition, grain size distribution and spatial distribution. To facilitate the use of this diagnostic, we present…
This study presents a comprehensive investigation into the exceptional superconducting attributes of titanium nitride (TiN) achieved through plasma-enhanced atomic layer deposition (PEALD) on both planar and intricate three-dimensional (3D)…
Neutron imaging is a non-destructive inspection technique with a wide range of applications. One of the important aspects concerning neutron imaging is achieving micrometer-scale spatial resolution. Developing a neutron detector with a high…
Extreme ultraviolet (EUV) scatterometry is an increasingly important metrology that can measure critical parameters of periodic nanostructured materials in a fast, accurate, and repeatable manner and with high sensitivity to nanoscale…
We propose a novel approach to detect the binding between proteins making use of the anomalous diffraction of natively present heavy elements inside the molecule 3D structure. In particular, we suggest considering sulfur atoms contained in…
This paper indicates that the sensitivity and accuracy of an infrared radiometer for emissivity measurements depends not only on its design and the measurement method, but also on the spurious radiation. This spurious radiation must be…
An object detection pipeline comprises a camera that captures the scene and an object detector that processes these images. The quality of the images directly affects the performance of the object detector. Many works nowadays focus either…
This paper details the development of high-quality, c-axis oriented AlN thin films up to 2 {\mu}m thick, using sputtering on platinum-coated SOI substrates for use in piezoelectric MEMS. Our comprehensive studies illustrate how important…
The association of scanning transmission electron microscopy (STEM) and the detection of a diffraction pattern at each probe position (so-called 4D-STEM) represents one of the most promising approaches to analyze structural properties of…
This work proposes an evolutionary computing-based image segmentation approach for analyzing soundness in Additive Friction Stir Deposition (AFSD) processes. Particle Swarm Optimization (PSO) was employed to determine optimal segmentation…
We report on an XPS study of AlN thin films grown on Si(100) substrates by ion beam sputter deposition (IBSD) in reactive assistance of N+/N2+ ions to unravel the compositional variation of their surface when deposited at different…
Computational spectrometers have mobile application potential, such as on-site detection and self-diagnosis, by offering compact size, fast operation time, high resolution, wide working range, and low-cost production. Although these…