Related papers: The automation of robust interatomic-force measure…
We experimentally surpass the 3dB limit to steady state parametric squeezing of a mechanical oscillator. The localization of a AFM cantilever, achieved by optimal estimation, is enhanced by up to 6.2 dB in one position quadrature when a…
A nanometric needle sensor mounted in an Atomic Force Microscopy allows systematic picometer-range distance measurements. This force sensing device is used in Piezoresponse Force Microscopy (PFM) as a distance sensor, by employing the…
We present a new approach to tuning fork-based atomic force microscopy for utilizing advanced "tip-on-chip" probes with high sensitivity and broad compatibility. Usually, such chip-like probes with a size reaching 2 mm x 2 mm drastically…
Measuring the mechanical response of liquid interfaces without direct contact remains a major experimental challenge, particularly in liquid-liquid systems where no solid reference exists. Here, we develop a frequency-modulation atomic…
Three-dimensional atomic force microscopy (3D-AFM) has been a powerful tool to probe the atomic-scale structure of solid-liquid interfaces. As a nanoprobe moves along the 3D volume of interfacial liquid, the probe-sample interaction force…
Atomic force microscopy (AFM) routinely achieves structural information in the sub-nm length scale. Measuring time resolved properties on this length scale to understand kinetics at the nm scale remains an elusive goal. We present a general…
Atom interferometry has become one of the most powerful technologies for precision measurements. To develop simple, precise, and versatile atom interferometers for inertial sensing, we demonstrate an atom interferometer measuring…
The ongoing development of single electron, nano and atomic scale semiconductor devices would benefit greatly from a characterization tool capable of detecting single electron charging events with high spatial resolution, at low…
The precise analysis and accurate measurement of harmonic provides a reliable scientific industrial application. However, the high-performance DSP processor is the important method of electrical harmonic analysis. Hence, in this research…
Using light as a probe to detect a mechanical motion is one of the most successful experimental approaches in physics. The history of mechanical sensing based on the reflection, refraction and scattering of light dates back to the 16th…
Atomic force microscopy is an important tool for characterizing surface acoustic waves, in particular for high frequencies, where the wavelength is too short to be resolved by laser interferometry. A caveat is, that the cantilever…
Amplitude-modulation atomic force microscopy enables observation of fragile molecules at the nanometer scale. To shorten measurement times and capture dynamic molecules, increasing the frame rate is essential. Traditionally, maximum frame…
Compared to conventional robots, flexible manipulators offer many advantages, such as faster end-effector velocities and less energy consumption. However, their flexible structure can lead to undesired oscillations. Therefore, the applied…
Direct time-varying tip-sample force measurements by torsional harmonic cantilevers facilitate detailed investigations of the cantilever dynamics in tapping-mode atomic force microscopy. Here we report experimental evidence that the…
Inertial sensors based on cold atom interferometry exhibit many interesting features for applications related to inertial navigation, particularly in terms of sensitivity and long-term stability. However, at present the typical atom…
A simulation of an atomic force microscope operating in the constant amplitude dynamic mode is described. The implementation mimics the electronics of a real setup including a digital phase-locked loop (PLL). The PLL is not only used as a…
Atomic gravimeters are the most accurate sensors for measuring gravity, yet a significant challenge lies in achieving high precision while also maintaining high dynamic range and robustness. Here, we develop a protocol for achieving robust…
Diverse applications in photonics and microwave engineering require a means of measurement of the instantaneous frequency of a signal. A photonic implementation typically applies an interferometer equipped with three or more output ports to…
An ongoing challenge in atomic force microscope (AFM) experiments is the quantitative measurement of cantilever motion. The vast majority of AFMs use the optical beam deflection (OBD) method to infer the deflection of the cantilever. The…
Accurate measurements of the nanoscale electromechanical coupling in materials, including piezo and ferroelectrics, twisted 2D layers, and biological systems is of both fundamental scientific and applied importance. Piezoresponse Force…