English

Time-varying tip-sample force measurements confirm steady-state dynamics in tapping-mode atomic force microscopy

Instrumentation and Detectors 2008-11-26 v1

Abstract

Direct time-varying tip-sample force measurements by torsional harmonic cantilevers facilitate detailed investigations of the cantilever dynamics in tapping-mode atomic force microscopy. Here we report experimental evidence that the mathematical relationships describing the steady state dynamics are quantitatively satisfied by the independent measurements of tip-sample forces over a broad range of experimental conditions. These results confirm the existing understanding of the tapping-mode atomic force microscopy and build confidence on the reliability of time-varying tip-sample force measurements by the torsional harmonic cantilevers.

Keywords

Cite

@article{arxiv.0712.2833,
  title  = {Time-varying tip-sample force measurements confirm steady-state dynamics in tapping-mode atomic force microscopy},
  author = {Ozgur Sahin},
  journal= {arXiv preprint arXiv:0712.2833},
  year   = {2008}
}

Comments

16 pages including 3 figures

R2 v1 2026-06-21T09:55:03.871Z