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On the characterisation of a Bragg spectrometer with X-rays from an ECR source

Atomic Physics 2009-11-10 v2

Abstract

Narrow X-ray lines from helium-like argon emitted from a dedicated ECR source have been used to determine the response function of a Bragg crystal spectrometer equipped with large area spherically bent silicon (111) or quartz (101ˉ\bar{1}) crystals. The measured spectra are compared with simulated ones created by a ray-tracing code based on the expected theoretical crystal's rocking curve and the geometry of the experimental set-up.

Cite

@article{arxiv.physics/0408081,
  title  = {On the characterisation of a Bragg spectrometer with X-rays from an ECR source},
  author = {D. F. Anagnostopoulos and S. Biri and D. Gotta and A. Gruber and Paul Indelicato and B. Leoni and H. Fuhrmann and L. M. Simons and L. Stingelin and A. Wasser and J. Zmeskal},
  journal= {arXiv preprint arXiv:physics/0408081},
  year   = {2009}
}

Comments

Version acceptee (NIM)

R2 v1 2026-07-22T19:00:21.806Z