Nanometer-scale sharpness in corner-overgrown heterostructures

L. Steinke; P. Cantwell; D. Zakharov; E. Stach; N. J. Zaluzec; A. Fontcuberta i Morral; M. Bichler; G. Abstreiter; M. Grayson

doi:10.1063/1.2988526

Nanometer-scale sharpness in corner-overgrown heterostructures

Materials Science 2009-11-13 v2 Mesoscale and Nanoscale Physics

Authors: L. Steinke , P. Cantwell , D. Zakharov , E. Stach , N. J. Zaluzec , A. Fontcuberta i Morral , M. Bichler , G. Abstreiter , M. Grayson

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Abstract

A corner-overgrown GaAs/AlGaAs heterostructure is investigated with transmission and scanning transmission electron microscopy, demonstrating self-limiting growth of an extremely sharp corner profile of 3.5 nm width. In the AlGaAs layers we observe self-ordered diagonal stripes, precipitating exactly at the corner, which are regions of increased Al content measured by an XEDS analysis. A quantitative model for self-limited growth is adapted to the present case of faceted MBE growth, and the corner sharpness is discussed in relation to quantum confined structures. We note that MBE corner overgrowth maintains nm-sharpness even after microns of growth, allowing the realization of corner-shaped nanostructures.

Keywords

semiconductor nanowire growth nanoparticles

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@article{arxiv.0803.3986,
  title  = {Nanometer-scale sharpness in corner-overgrown heterostructures},
  author = {L. Steinke and P. Cantwell and D. Zakharov and E. Stach and N. J. Zaluzec and A. Fontcuberta i Morral and M. Bichler and G. Abstreiter and M. Grayson},
  journal= {arXiv preprint arXiv:0803.3986},
  year   = {2009}
}

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4 pages, 3 figures

Nanometer-scale sharpness in corner-overgrown heterostructures

Abstract

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