Annealing-Dependent Magnetic Depth Profile in Ga[1-x]Mn[x]As

B. J. Kirby; J. A. Borchers; J. J. Rhyne; S. G. E. te Velthuis; A. Hoffmann; K. V. O'Donovan; T. Wojtowicz; X. Liu; W. L. Lim; J. K. Furdyna

doi:10.1103/PhysRevB.69.081307

Annealing-Dependent Magnetic Depth Profile in Ga[1-x]Mn[x]As

Materials Science 2009-11-10 v2

Authors: B. J. Kirby , J. A. Borchers , J. J. Rhyne , S. G. E. te Velthuis , A. Hoffmann , K. V. O'Donovan , T. Wojtowicz , X. Liu , W. L. Lim , J. K. Furdyna

View on arXiv ↗ PDF ↗ DOI ↗

Abstract

We have studied the depth-dependent magnetic and structural properties of as-grown and optimally annealed Ga[1-x]Mn[x]As films using polarized neutron reflectometry. In addition to increasing total magnetization, the annealing process was observed to produce a significantly more homogeneous distribution of the magnetization. This difference in the films is attributed to the redistribution of Mn at interstitial sites during the annealing process. Also, we have seen evidence of significant magnetization depletion at the surface of both as-grown and annealed films.

Keywords

GaMnAs annealing magnetic depth profile polarized neutron reflectometry Mn interstitial sites

Cite

@article{arxiv.cond-mat/0311119,
  title  = {Annealing-Dependent Magnetic Depth Profile in Ga[1-x]Mn[x]As},
  author = {B. J. Kirby and J. A. Borchers and J. J. Rhyne and S. G. E. te Velthuis and A. Hoffmann and K. V. O'Donovan and T. Wojtowicz and X. Liu and W. L. Lim and J. K. Furdyna},
  journal= {arXiv preprint arXiv:cond-mat/0311119},
  year   = {2009}
}

Comments

5 pages, 3 figures

Annealing-Dependent Magnetic Depth Profile in Ga[1-x]Mn[x]As

Abstract

Keywords

Cite

Comments

Related papers