相关论文: Demonstration of an electrostatic-shielded cantile…
Scanning probe microscopy is often extended beyond topographic imaging to study electrical forces and sample properties, with the most widely used experiment being frequency-modulated Kelvin probe force microscopy. The equations commonly…
We investigated insulating Cu$_2$N islands grown on Cu(100) by means of combined scanning tunneling microscopy and atomic force microscopy with two vastly different tips: a bare metal tip and a CO-terminated tip. We use scanning tunneling…
We describe a novel monolithic ion trap that combines the flexibility and scalability of silicon microfabrication technologies with the superior trapping characteristics of traditional four-rod Paul traps. The performace of the proposed…
This study introduces a straightforward electrode design featuring sharp edges with a curvature of a few hundred nanometers in radius, with which both ion accumulation and nanoparticle deposition can be observed under an alternating…
We present a mechanical cantilever-based tabletop interferometer to measure the radiation force exerted by light. Using a high-power (~ 1W) pulsed laser beam, we excite mechanical oscillations in a thin metallic cantilever. The cantilever…
Ion traps are a promising architecture to host a future quantum computer. Several challenges, such as signal-routing, power dissipation, and fabrication quality need to be overcome to scale ion trap devices to hundreds of ions. Currently,…
In this work, we present a detailed investigation of the magnetic properties of cobalt nanospheres grown on cantilever tips by Focused Electron Beam Induced Deposition (FEBID). The cantilevers are extremely soft and the cobalt nanospheres…
Aligning a microcantilever to an area of interest on a sample is a critical step in many scanning probe microscopy experiments, particularly those carried out on devices and rare, precious samples. We report a series of protocols that…
The quantitative nanomechanical characterization of soft materials using the nanoindentation technique requires further improvements in the performances of instruments, including their force resolution in particular. A micro-machined…
We use the charged tip of a low temperature scanning probe microscope to perturb the transport through a graphene nanoconstriction. Maps of the conductance as a function of tip position display concentric halos, and by following the…
Colloidal probes are often used in force microscopy when the geometry of the tip-sample interaction should be well controlled. Their calibration requires the understanding of their mechanical response, which is very sensitive to the details…
We demonstrate a method for manipulating small ensembles of vortices in multiply-connected superconducting structures. A micron-size magnetic particle attached to the tip of a silicon cantilever is used to locally apply magnetic flux…
A new geometry to trap neutral particles with an ac electric field using a simple electrodes structure is described. In this geometry, all electrodes are placed on a single chip plane, while particles are levitated above the chip. This…
The first successful attempts to optimize the electric field in Resistive Microstrip Gas Chamber and resistive microdot detectors using additional field shaping strips located inside the detector substrate are described
We report on the fabrication and performance of a new kind of tip for scanning tunneling microscopy. By fully incorporating a metallic tip on a silicon chip using modern micromachining and nanofabrication techniques, we realize so-called…
We demonstrate that a set of microfabricated electrodes can be coupled to a commercial optical tweezers device, implementing a hybrid electro-optical trap with multiple functionalities to manipulate micro/nanoparticles in suspension. Our…
We use Kelvin Force Microscopy (KFM) to study the electrostatic properties of single-walled Carbon Nanotube Field Effect Transistor devices (CNTFETs) with backgate geometry at room temperature. We show that KFM maps recorded as a function…
Solid-state devices can be fabricated at the atomic scale, with applications ranging from classical logic to current standards and quantum technologies. While it is very desirable to probe these devices and the quantum states they host at…
We report the development of a scanning force microscope based on an ultra-sensitive silicon nitride membrane transducer. Our development is made possible by inverting the standard microscope geometry - in our instrument, the substrate is…
The distance dependence and atomic-scale contrast observed in nominal contact potential difference (CPD) signals recorded by KPFM on surfaces of insulating and semiconducting samples, have stimulated theoretical attempts to explain such…