相关论文: Force-distance studies with piezoelectric tuning f…
The use of electrophoretic forces to tune friction at material-nanoparticle-liquid interfaces with static or low frequency (0.6-50 mHz) electric fields is reported for the first time. External electric fields were employed to reposition…
Force sensors are at the heart of different technologies such as atomic force microscopy or inertial sensing \cite{RMPforce2003, Rugar2004, YazdiIEEE}. These sensors often rely on the measurement of the displacement amplitude of mechanical…
An ultra-sensitive opto-mechanical force sensor has been built and tested in the optics laboratory at INFN Trieste. Its application to experiments in the Dark Energy sector, such as those for Chameleon-type WISPs, is particularly…
Dynamic phase microscopy has been applied for measurements of nanometer-scale displacements of a piezoelectric scanner. This scanner, which was designed for calibration purposes for scanning probe microscopy and TEM, exhibited a linear and…
We propose and evaluate a new type of optical force microscope based on a standing wave optical trap. Our microscope, calibrated in-situ and operating in a dynamic mode, is able to trap, without heating, a single metallic nanoparticle of…
This article describes how a frequency modulation AFM using a hanging fiber force probe made from a quartz tuning fork provides local measurements on liquid-liquid interfaces. After detailing the manufacture and calibration of the force…
We experimentally surpass the 3dB limit to steady state parametric squeezing of a mechanical oscillator. The localization of a AFM cantilever, achieved by optimal estimation, is enhanced by up to 6.2 dB in one position quadrature when a…
The electric forces acting on an atomic force microscope tip in solution have been measured using a microelectrochemical cell formed by two periodically biased electrodes. The forces were measured as a function of lift height and bias…
A photonic force microscope comprises of an optically trapped micro-probe and a position detection system to track the motion of the probe. Signal collection for motion detection is often carried out using the backscattered light off the…
A common use for atomic force microscopy is to quantify local forces through tip-sample interactions between the probe tip and a sample surface. The accuracy of these measurements depends on the accuracy to which the cantilever spring…
Electrostatic force microscopy at cryogenic temperatures was used to probe the electrostatic interaction between a conductive atomic force microscopy tip and electronic charges trapped in an InAs quantum dot. Measurement of the…
We describe here the implementation of an interferometer-based microwave impedance microscope on a home-built tuning-fork based scanning probe microscope (SPM). Tuning-fork based SPMs, requiring only two electrical contacts for…
Direct time-varying tip-sample force measurements by torsional harmonic cantilevers facilitate detailed investigations of the cantilever dynamics in tapping-mode atomic force microscopy. Here we report experimental evidence that the…
Planar, double-torsional oscillators are especially suitable for short-range macroscopic force search experiments, since they can be operated at the limit of instrumental thermal noise. As a study of this limit, we report a measurement of…
Piezoresponse Force Microscopy is a powerful but delicate nanoscale technique that measures the mechanical response resulting from the application of a highly localized electric field. Though mechanical response is normally due to…
Flexural mode vibrations of miniature piezoelectric tuning forks (TF) are known to be highly sensitive to superfluid excitations and quantum turbulence in $\mathrm{^3He}$ and $\mathrm{^4He}$ quantum fluids, as well as to the elastic…
We explain and demonstrate a new method of force- and position-calibration for optical tweezers with back-focal-plane photo detection. The method combines power spectral measurements of thermal motion and the response to a sinusoidal motion…
A new technique for the fabrication of highly sensitive qPlus sensor for atomic force microscopy (AFM) is described. Focused ion beam was used to cut then weld onto a bare quartz tuning fork a sharp micro-tip from an electrochemically…
Frequency-modulation atomic force microscopy provides an outstanding precision of the measurement of chemical bonding forces. However, as the cantilever oscillates with an amplitude A that is usually on the order of atomic dimensions or…
We report the development of an ultrasensitive optomechanical sensor designed to improve the accuracy and precision of force measurements with atomic force microscopy. The sensors reach quality factors of 4.3x10^6 and force resolution on…